Silicon carbide (SiC) is emerging rapidly in novel photonic applications thanks to its unique photonic properties facilitated by the advances of nanotechnologies such as nanofabrication and nanofilm transfer. This review paper will start with the introduction of exceptional optical properties of silicon carbide. Then, a key structure, i.e., silicon carbide on insulator stack (SiCOI), is discussed which lays solid fundament for tight light confinement and strong light-SiC interaction in high quality factor and low volume optical cavities. As examples, microring resonator, microdisk and photonic crystal cavities are summarized in terms of quality (Q) factor, volume and polytypes. A main challenge for SiC photonic application is complementary metal-oxide-semiconductor (CMOS) compatibility and low-loss material growth. The state-of-the-art SiC with different polytypes and growth methods are reviewed and a roadmap for the loss reduction is predicted for photonic applications. Combining the fact that SiC possesses many different color centers with the SiCOI platform, SiC is also deemed to be a very competitive platform for future quantum photonic integrated circuit applications. Its perspectives and potential impacts are included at the end of this review paper.
Silicon carbide, a wide bandgap semiconductor material platform, has emerged as an exceptional material for nonlinear integrated photonics. Among the different poly-structures, 4H-silicon carbide-on-insulator stacks show promising results to their low loss, which are crucial for commercial applications like communication, metrology, and spectroscopy. High Q-values and low-loss microring resonators are imperative for miniaturization and photonic integration in these applications. This Perspective emphasizes recent advancements in enhancing the quality factor of microresonators based on 4H-silicon carbide, as well as the strides made in experimental results of third-order nonlinearities. Furthermore, this Letter addresses and outlines the prospects of integrating 4H-silicon carbide microring resonators into frequency comb technologies and potential applications.
Silicon carbide (SiC) has become a promising optical material for quantum photonics and nonlinear photonics during the past decade. In this work, we propose two methods to improve the 4H-SiC thin film quality for SiC integrated photonic chips. Firstly, we develop a wet-oxidation-assisted chemical mechanical polishing (CMP) process for 4H-SiC, which can significantly decrease the surface roughness from 3.67 nm to 0.15 nm, thus mitigating the light scattering loss. Secondly, we find that the thermal annealing of the 4H-SiC devices at 1300 °C can help to decrease the material absorption loss. We experimentally demonstrate that the wet-oxidation-assisted CMP and the high-temperature annealing can effectively increase the intrinsic quality factor of the 4H-SiC optical microring resonators.
Kerr nonlinear microcavities have garnered significant interest owing to their rich dynamics of nonlinear optical phenomena and compatibility with on-chip photonic integration. Recently, silicon carbide has emerged as a compelling platform due to its unique optical properties. In this study, we demonstrate Raman-assisted and Kerr optical frequency generation in a 4H-silicon carbide-on-insulator microresonator. By pumping the transverse electric (TE00) mode within the device, we observe a stimulated Raman scattering (SRS) Stokes with the Raman shift at approximately 775 cm-1, achieved with an on-chip power of 350 mW. Furthermore, by red-tuning the TE00 pump wavelength, we have achieved the coexistence of Raman and Kerr frequency combs. Using another device on the same chip with light variation of the taper we can observe the Raman and Kerr frequency combs within a spectral bandwidth ranging from ∼ 1440 to 1960 nm. The inclusion of the Raman-assisted comb extends the comb’s coverage into longer wavelength regimes, making it highly desirable for spectroscopy applications.