Shuibin Liu

Shuibin Liu


Research Focus & Metrics

Academic Career Length

4Years (2023-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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3 January 2023 in Micromachines
Verified
Journal Article
Open access
PDF file
CHChunhua He
Chunhua He
SLShuibin Liu
Shuibin Liu
GZGuangxiong Zhong
Guangxiong Zhong
HWHeng Wu
Heng Wu
LCLianglun Cheng
Lianglun Cheng
QHQinwen Huang
Qinwen Huang
The ratio of the elderly to the total population around the world is larger than 10%, and about 30% of the elderly are injured by falls each year. Accidental falls, especially bathroom falls, account for a large proportion. Therefore, fall events detection of the elderly is of great importance. In this article, a non-contact fall detector based on a Micro-electromechanical Systems Pyroelectric Infrared (MEMS PIR) sensor and a thermopile IR array sensor is designed to detect bathroom falls. Besides, image processing algorithms with a low pass filter and double boundary scans are put forward in detail. Then, the statistical features of the area, center, duration and temperature are extracted. Finally, a 3-layer BP neural network is adopted to identify the fall events. Taking into account the key factors of ambient temperature, objective, illumination, fall speed, fall state, fall area and fall scene, 640 tests were performed in total, and 5-fold cross validation is adopted. Experimental results demonstrate that the averages of the precision, recall, detection accuracy and F1-Score are measured to be 94.45%, 90.94%, 92.81% and 92.66%, respectively, which indicates that the novel detection method is feasible. Thereby, this IOT detector can be extensively used for household bathroom fall detection and is low-cost and privacy-security guaranteed.

20 October 2023 in Micromachines
Verified
Journal Article
Open access
PDF file
YXYingyu Xu
Yingyu Xu
SLShuibin Liu
Shuibin Liu
CHChunhua He
Chunhua He
HWHeng Wu
Heng Wu
LCLianglun Cheng
Lianglun Cheng
GYGuizhen Yan
Guizhen Yan
MEMS gyroscopes are widely applied in consumer electronics, aerospace, missile guidance, and other fields. Reliable packaging is the foundation for ensuring the survivability and performance of the sensor in harsh environments, but gas leakage models of wafer-level MEMS gyroscopes are rarely reported. This paper proposes a gas leakage model for evaluating the packaging reliability of wafer-level MEMS gyroscopes. Based on thermodynamics and hydromechanics, the relationships between the quality factor, gas molecule number, and a quality factor degradation model are derived. The mechanism of the effect of gas leakage on the quality factor is explored at wafer-level packaging. The experimental results show that the reciprocal of the quality factor is exponentially related to gas leakage time, which is in accordance with the theoretical analysis. The coefficients of determination (R2) are all greater than 0.95 by fitting the curves in Matlab R2022b. The stable values of the quality factor for drive mode and sense mode are predicted to be 6609.4 and 1205.1, respectively, and the average degradation characteristic time is 435.84 h. The gas leakage time is at least eight times the average characteristic time, namely 3486.72 h, before a stable condition is achieved in the packaging chamber of the MEMS gyroscopes.