Maria Katsikini

Prof. Dr. Maria Katsikini

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Research Focus & Metrics

Academic Career Length

31Years (1996-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 October 2003 in Journal of Applied Physics
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Journal Article
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MKMaria Katsikini
Maria Katsikini
KPKonstantinos Papangelis
Konstantinos Papangelis
EPE. C. Paloura
E. C. Paloura
SVS. Ves
S. Ves
The effect of Mg, Si, N, and O ion implantation (with doses in the range 5×1013–1×1018 cm−2), in epitaxially grown GaN samples has been studied using Raman spectroscopy. It is found that implantation increases the static disorder and activates modes that were not allowed in the as-grown material. More specifically it causes the appearance of three additional Raman peaks at 300, 420, and 670 cm−1. It is found that the position of these peaks does not depend on the type of the implant and thus they do not correspond to local vibrational modes. They are attributed to disorder activated Raman scattering (300 cm−1) and/or to implantation induced N and Ga vacancies or interstitials (420 and 670 cm−1). Finally, ion implantation causes a marginal increase of the build-in hydrostatic stress.

9 June 2014 in Dalton Transactions
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Journal Article
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KVKosmas Vamvakidis
Kosmas Vamvakidis
MKMaria Katsikini
Maria Katsikini
DSD. Sakellari
D. Sakellari
EPE. C. Paloura
E. C. Paloura
OKOrestis Kalogirou
Orestis Kalogirou
Catherine Dendrinou-SamaraCatherine Dendrinou-Samara
Catherine Dendrinou-Samara
MnFe 2 O 4 nanoparticles of low inversion degree present optimized magnetization with high ( T 2 ) relaxation (345.5 s −1 mM −1 ) and heating efficiency (286 W g −1 ).

4 July 2014 in The Journal of Physical Chemistry C
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Journal Article
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MFMaria Filippousi
Maria Filippousi
MAMAKIS ANGELAKERIS
MAKIS ANGELAKERIS
MKMaria Katsikini
Maria Katsikini
EPEleni Paloura
Eleni Paloura
IEIlias Efthimiopoulos
Ilias Efthimiopoulos
GTGustaaf Van Tendeloo
Gustaaf Van Tendeloo

26 July 2013 in Environmental Science & Technology
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Journal Article
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STSofia Tresintsi
Sofia Tresintsi
Konstantinos SimeonidisKonstantinos Simeonidis
Konstantinos Simeonidis
SESonia Estradé
Sonia Estradé
Carlos Martinez-BoubetaCarlos Martinez-Boubeta
Carlos Martinez-Boubeta
GVGeorge Vourlias
George Vourlias
MMManassis Mitrakas
Manassis Mitrakas

1 January 2014 in Journal of Hazardous Materials
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Journal Article
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STSofia Tresintsi
Sofia Tresintsi
Konstantinos SimeonidisKonstantinos Simeonidis
Konstantinos Simeonidis
MKMaria Katsikini
Maria Katsikini
EPEleni C. Paloura
Eleni C. Paloura
GBGeorgios Bantsis
Georgios Bantsis
Manassis MitrakasManassis Mitrakas
Manassis Mitrakas

1 February 1998 in Journal of Applied Physics
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Journal Article
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MKMaria Katsikini
Maria Katsikini
EPE. C. Paloura
E. C. Paloura
TMT. D. Moustakas
T. D. Moustakas
Hexagonal, cubic, and mixed phase GaN samples grown by molecular beam epitaxy are studied using near-edge x-ray absorption fine structure (NEXAFS) spectroscopy. The spectra were recorded at the N-K-edge, at several angles of incidence. It is shown that the N-K-edge NEXAFS spectra, which are proportional to the p -partial density of states in the conduction band, are characteristic of the cubic or hexagonal structure of the examined crystal. The spectra of the cubic sample do not depend on the angle of incidence (θ), contrary to the spectra of the hexagonal sample in which the areas under the NEXAFS resonances depend linearly on cos2 θ. From the fitting of the lines Ai=A+B cos2 θ, where Ai are the areas under the resonances and A and B are constants, the directions of maximum electron charge density with respect to the normal to the surface are determined for the hexagonal sample. The energy positions of the absorption edge and the NEXAFS resonances in the spectra from the cubic sample are different from those of the hexagonal sample and in either case are independent of θ. Contrary to that, the energy positions of the NEXAFS resonances in a mixed phase sample have a characteristic angular dependence and shift between the energies corresponding to the cubic and hexagonal polytypes. Based on this observation, we propose that the spectrum of the mixed-phase sample can be approximated as the weighted average of the spectra from the pure cubic and hexagonal samples. From this approximation the coexisting fractions of α- and β-GaN in a mixed-phase sample are determined and they are found in good agreement with results from high resolution transmission electron microscopy and x-ray diffraction.