Chih-Hao Lee obtained his Bachelor's degree (1977), Master's degree (1979), and Ph.D. (1987) from National Tsing Hua University (NTHU), Hsinchu, Taiwan. He conducted research at the EXXON Research and Engineering Company, USA (1988–1990), as well as the National Synchrotron Radiation Research Center in Taiwan (1990–1995), and has been a Professor at NTHU since 1995. His major research areas include the applications of synchrotron X-rays and neutron beams to understand crystallographic structure and to correlate it with the material chemistry and physical properties of thin films.