Porfirio Tramontana

Prof. Porfirio Tramontana

Department of Electrical Engineering and Information Technology, University of Naples Federico II, 80138 Naples, Italy
orcid

Research Focus & Metrics

Academic Career Length

20Years (2007-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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24 October 2018 in Software Quality Journal
Verified
Journal Article
Closed access
PDF file
Porfirio TramontanaPorfirio Tramontana
Porfirio Tramontana
DADomenico Amalfitano
Domenico Amalfitano
NANicola Amatucci
Nicola Amatucci
Anna Rita FasolinoAnna Rita Fasolino
Anna Rita Fasolino

1 March 2017 in Journal of Systems and Software
Verified
Journal Article
Closed access
DADomenico Amalfitano
Domenico Amalfitano
NANicola Amatucci
Nicola Amatucci
AMAtif M. Memon
Atif M. Memon
Porfirio TramontanaPorfirio Tramontana
Porfirio Tramontana
Anna Rita FasolinoAnna Rita Fasolino
Anna Rita Fasolino

18 March 2013
Verified
Book Chapter
Closed access
DADomenico Amalfitano
Domenico Amalfitano
Anna Rita FasolinoAnna Rita Fasolino
Anna Rita Fasolino
Porfirio TramontanaPorfirio Tramontana
Porfirio Tramontana
BRBryan Robbins
Bryan Robbins

16 October 2020 in Software Testing, Verification and Reliability
Verified
Journal Article
Closed access
PDF file
Sergio Di MartinoSergio Di Martino
Sergio Di Martino
Anna Rita FasolinoAnna Rita Fasolino
Anna Rita Fasolino
LSLuigi Libero Lucio Starace
Luigi Libero Lucio Starace
Porfirio TramontanaPorfirio Tramontana
Porfirio Tramontana

14 January 2020 in IEEE Access
Verified
Journal Article
Open access
DADomenico Amalfitano
Domenico Amalfitano
VRVincenzo Riccio
Vincenzo Riccio
Porfirio TramontanaPorfirio Tramontana
Porfirio Tramontana
Anna Rita FasolinoAnna Rita Fasolino
Anna Rita Fasolino
Memory leaks represent a remarkable problem for mobile app developers since a waste of memory due to bad programming practices may reduce the available memory of the device, slow down the apps, reduce their responsiveness and, in the worst cases, they may cause the crash of the app. A common cause of memory leaks in the specific context of Android apps is the bad handling of the events tied to the Activity Lifecycle. In order to detect and characterize these memory leaks, we present FunesDroid, a toolsupported black box technique for the automatic detection of memory leaks tied to the Activity Lifecycle in Android apps. FunesDroid implements a testing approach that can find memory leaks by analyzing unnecessary heap object replications after the execution of three different sequences of Activity Lifecycle events. In the paper, we present an exploratory study that shows the capability of the proposed technique to detect memory leaks and to characterize them in terms of their size, persistence and growth trend. The study also illustrates how memory leak causes can be detected with the support of the information provided by the FunesDroid tool.

30 April 2013 in Innovations in Systems and Software Engineering
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Journal Article
Closed access
DADomenico Amalfitano
Domenico Amalfitano
Anna Rita FasolinoAnna Rita Fasolino
Anna Rita Fasolino
APArmando Polcaro
Armando Polcaro
Porfirio TramontanaPorfirio Tramontana
Porfirio Tramontana