Jakub Szlachetko

Prof. Jakub Szlachetko


Research Focus & Metrics

Academic Career Length

22Years (2005-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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14 July 2017 in Applied Sciences
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Journal Article
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CMChristopher Milne
Christopher Milne
TSThomas Schietinger
Thomas Schietinger
MAMasamitsu Aiba
Masamitsu Aiba
AAArturo Alarcon
Arturo Alarcon
JAJürgen Alex
Jürgen Alex
HBHans-Heinrich Braun
Hans-Heinrich Braun
The SwissFEL X-ray Free Electron Laser (XFEL) facility started construction at the Paul Scherrer Institute (Villigen, Switzerland) in 2013 and will be ready to accept its first users in 2018 on the Aramis hard X-ray branch. In the following sections we will summarize the various aspects of the project, including the design of the soft and hard X-ray branches of the accelerator, the results of SwissFEL performance simulations, details of the photon beamlines and experimental stations, and our first commissioning results.

9 June 2015 in Angewandte Chemie International Edition
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Journal Article
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RKRené Kopelent
René Kopelent
JBJeroen A. van Bokhoven
Jeroen A. van Bokhoven
JSJakub Szlachetko
Jakub Szlachetko
JEJacinta Edebeli
Jacinta Edebeli
CPCristina Paun
Cristina Paun
OSOlga V. Safonova
Olga V. Safonova

1 October 2012 in Review of Scientific Instruments
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Journal Article
Closed access
JSJakub Szlachetko
Jakub Szlachetko
MNM. Nachtegaal
M. Nachtegaal
EBE. de Boni
E. de Boni
MWM. Willimann
M. Willimann
OSO. Safonova
O. Safonova
ALA. Lücke
A. Lücke
We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.

28 February 2012 in The Journal of Physical Chemistry C
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Journal Article
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CPCristina Paun
Cristina Paun
OSOlga V. Safonova
Olga V. Safonova
JSJakub Szlachetko
Jakub Szlachetko
PAPaula Macarena Abdala
Paula Macarena Abdala
MNMaarten Nachtegaal
Maarten Nachtegaal
JBJeroen A. van Bokhoven
Jeroen A. van Bokhoven

2 February 2018 in Nature Communications
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Journal Article
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TPThomas J. Penfold
Thomas J. Penfold
JSJakub Szlachetko
Jakub Szlachetko
FSFabio G. Santomauro
Fabio G. Santomauro
ABAlexander Britz
Alexander Britz
WGWojciech Gawelda
Wojciech Gawelda
CMChristopher Milne
Christopher Milne
Nanostructures of transition metal oxides, such as zinc oxide, have attracted considerable interest for solar-energy conversion and photocatalysis. Both applications are sensitive to the transport and trapping of photoexcited charge carriers. The probing of electron trapping has recently become possible using time-resolved element-sensitive methods, such as X-ray spectroscopy. However, valence-band-trapped holes have so far escaped observation. Herein we use X-ray absorption spectroscopy combined with a dispersive X-ray emission spectrometer to probe the charge carrier relaxation and trapping processes in zinc oxide nanoparticles after above band-gap photoexcitation. Our results, supported by simulations, demonstrate that within 80 ps, photoexcited holes are trapped at singly charged oxygen vacancies, which causes an outward displacement by ~15% of the four surrounding zinc atoms away from the doubly charged vacancy. This identification of the hole traps provides insight for future developments of transition metal oxide-based nanodevices.

1 October 2016 in Review of Scientific Instruments
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Journal Article
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ZNZoltán Németh
Zoltán Németh
JSJakub Szlachetko
Jakub Szlachetko
ÉBÉva G. Bajnóczi
Éva G. Bajnóczi
GVGyörgy Vankó
György Vankó
High energy resolution, hard X-ray spectroscopies are powerful element selective probes of the electronic and local structure of matter, with diverse applications in chemistry, physics, biology, and materials science. The routine application of these techniques is hindered by the complicated and slow access to synchrotron radiation facilities. Here we propose a new, economic, easily operated laboratory high resolution von Hámos type X-ray spectrometer, which offers rapid transmission experiments for X-ray absorption and is also capable of recording X-ray emission spectra. The use of a cylindrical analyzer crystal and a position sensitive detector enabled us to build a robust, flexible setup with low operational costs, while delivering synchrotron grade signal to noise measurements in reasonable acquisition times. We demonstrate the proof of principle and give examples for both measurement types. Finally, tracking of a several day long chemical transformation, a case better suited for laboratory than synchrotron investigation, is also presented.