Tetiana Bubela

Prof. Dr. Tetiana Bubela

orcid

Research Focus & Metrics

Academic Career Length

13Years (2014-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 January 2024 in AIP Conference Proceedings
Verified
Conference Paper
Open access
PDF file
HHHanna Hrinchenko
Hanna Hrinchenko
OKOleksandr Kupriyanov
Oleksandr Kupriyanov
RTRoman Trishch
Roman Trishch
NANataliia Antonenko
Nataliia Antonenko
TBTetiana Bubela
Tetiana Bubela
The article explores strategies to guarantee the reliable performance of power equipment as part of the efforts to ensure the safety of energy complexes during



1 January 2020 in Measuring Equipment and Metrology
Verified
Journal Article
Closed access
YPYevhen Pokhodylo
Yevhen Pokhodylo
VYVasyl Yatsuk
Vasyl Yatsuk
TBTetiana Bubela
Tetiana Bubela

1 January 2019 in Measuring Equipment and Metrology
Verified
Journal Article
Closed access
LULviv Polytechnic National University
Lviv Polytechnic National University
BSBohdan Stadnyk
Bohdan Stadnyk
SYSvyatoslav Yatsyshyn
Svyatoslav Yatsyshyn
YLYaroslav Lutsyk
Yaroslav Lutsyk
TBTetiana Bubela
Tetiana Bubela
TFThomas Fröhlich
Thomas Fröhlich

16 September 2022 in Metrology and Measurement Systems
Verified
Journal Article
Open access
PDF file
TBTetiana Bubela
Tetiana Bubela
RKRoman Kochan
Roman Kochan
ŁWŁukasz Więcław
Łukasz Więcław
VYVasyl Yatsuk
Vasyl Yatsuk
VKViktor Kuts
Viktor Kuts
JYJurij Yatsuk
Jurij Yatsuk
The authors update the issue disassembly-free control and correction of all components of the error of measuring channels with multi-bit analog-to-digital converters (ADCs). The main disadvantages of existing methods for automatic control of the parameters of multi-bit ADCs, in particular their nonlinearity, are identified. Methods for minimizing instrumental errors and errors caused by limited internal resistances of closed switches, input and output resistances of active elements are investigated. The structures of devices for determining the multiplicative and nonlinear components of the error of multi-bit ADCs based on resistive dividers built on single-nominal resistors are proposed and analyzed. The authors propose a method for the correction of additive, multiplicative and nonlinear components of the error at each of the specified points of the conversion range during non-disassembly control of the ADC with both types of inputs. The possibility of non-disassembly control, as well as correction of multiplicative and nonlinear components of the error of multi-bit ADCs in the entire range of conversion during their on-site control is proven. ADC error correction procedures are proposed. These procedures are practically invariant to the non-informative parameters of active structures with resistive dividers composed of single-nominal resistors. In the article the prospects of practical implementation of the method of error correction during non-dismantling control of ADC parameters using the possibilities provided by modern microelectronic components are shown. The ways to minimize errors are proposed and the requirements to the choice of element parameters for the implementation of the proposed technical solutions are given. It is proved that the proposed structure can be used for non-disassembly control of multiplicative and nonlinear components of the error of precision instrumentation amplifiers.