Qiang He

Dr. Qiang He

orcid

Research Focus & Metrics

Academic Career Length

18Years (2009-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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13 December 2023 in Advances in Colloid and Interface Science
Verified
Journal Article
Closed access
Qiang HeQiang He
Qiang He
YXYuan Xu
Yuan Xu
FZFangyuan Zhang
Fangyuan Zhang
YJYangyang Jia
Yangyang Jia
ZDZhicai Du
Zhicai Du
ALAnling Li
Anling Li

16 November 2020 in Advanced Materials Interfaces
Verified
Journal Article
Closed access
PDF file
GWGuangfei Wang
Guangfei Wang
ALAnling Li
Anling Li
WZWen Zhao
Wen Zhao
ZXZehua Xu
Zehua Xu
YMYongwei Ma
Yongwei Ma
Qiang HeQiang He
Qiang He

10 July 2023 in Chinese Journal of Aeronautics
Verified
Journal Article
Open access
Qiang HeQiang He
Qiang He
KLKangshuai Li
Kangshuai Li
ZXZehua Xu
Zehua Xu
JWJiwen Wang
Jiwen Wang
XWXiaosen Wang
Xiaosen Wang
ALAnling Li
Anling Li

19 August 2023 in Materials & Design
Verified
Journal Article
Open access
Qiang HeQiang He
Qiang He
JWJiwen Wang
Jiwen Wang
GWGuangfei Wang
Guangfei Wang
XHXiaxia Hao
Xiaxia Hao
ALAnling Li
Anling Li

1 April 2021 in Journal of Colloid and Interface Science
Verified
Journal Article
Closed access
GWGuangfei Wang
Guangfei Wang
ALAnling Li
Anling Li
KLKangshuai Li
Kangshuai Li
YZYaohui Zhao
Yaohui Zhao
YMYongwei Ma
Yongwei Ma
Qiang HeQiang He
Qiang He

3 February 2018 in Applied Nanoscience
Verified
Journal Article
Open access
PDF file
Qiang HeQiang He
Qiang He
In this paper, superfine SiO2 nanoparticles are utilized as composite abrasive additive to improve the polishing property of CeO2, which is prepared through chemical precipitation method by rare-earth chloride as raw materials, silicofluoric acid as fluoride, Na2CO3 as modifier, and NH4HCO3 as precipitator. XRD, SEM, particle size analyzer, and atomic force microscopy are applied to characterize the physical structure, morphology, and size distribution. Furthermore, the as-prepared composite abrasive is used to perform chemical mechanical polishing (CMP) experiment on K9 glass to identify the impact of different mass fraction of SiO2 on the CMP property of work materials. The results show that the composite abrasive contained 0.5% SiO2 has the best polishing property, the surface roughness, and material removal rate of glass after polishing can reach at 1.3157 nm and 22.6 nm/min, respectively.