As nano-electronic technology makes electronic devices gradually microscopic in size and diversified in function, obtaining new materials with superior performance is the main goal at this stage. Interfaces formed by adjacent layers of material in electronic devices affect their performance, as does the strain caused by lattice mismatch, which can be simulated and analyzed by theoretical calculations. The common period of the cell changes when the van der Waals (vdW) material is twisted. Therefore, it is a significant challenge to determine the common supercell of two crystals constituting the interface. Here. we present a novel cell matching algorithm for twisted bilayer vdW materials with orthogonal unit cells, where the resulting common supercell remains orthogonal and only angular strains exist without linear strains, facilitating accuracy control. We apply this method to 2-Pmmn twisted bilayer borophene. It can automatically find the resource-allowed common supercell at multiple rotation angles or fix the rotation angle to find the proper accuracy.