Jiamin Liu received his Ph.D. in Mechanical Engineering from Huazhong University of Science and Technology (HUST) in 2020. Currently, he is engaged in post-doctoral research at the Nanoscale and Optical Metrology (NOM) Research Center led by Prof. Shiyuan Liu. His main research directions are the ellipsometric method for dynamic processes and computational imaging for patterned wafer inspection. He has published over 30 papers and 20 patents involving ellipsometry and polarimetry, computational lithography, and patterned wafer inspection.