Yu Huang

Dr. Yu Huang

orcid

Research Focus & Metrics

Academic Career Length

23Years (2004-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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28 January 2021 in IEEE Transactions on Industrial Electronics
Verified
Journal Article
Closed access
YHYu Huang
Yu Huang
YTYufei Tang
Yufei Tang
JVJames VanZwieten
James VanZwieten
Prognostics predicts the future performance progression and remaining useful life (RUL) of in-service systems based on historical and contemporary data. One of the challenges in prognostics is the development of methods that are capable of handling real-world uncertainties that typically lead to inaccurate predictions. To alleviate the impacts of uncertainties and to achieve accurate degradation trajectory and RUL predictions, a novel sequence-to-sequence predictive model is proposed based on a variational autoencoder that is trained with generative adversarial networks. A long short-term memory network and a Gaussian mixture model are utilized as building blocks so that the model is capable of providing probabilistic predictions. Correlative and monotonic metrics are applied to identify sensitive features in the degradation progress, in order to reduce the uncertainty induced from raw data. Then, the selected features are concatenated with one-hot health state indicators as training data for the model to learn end of life without the need for prior knowledge of failure thresholds. Performance of the proposed model is validated by health monitoring data collected from real-world aeroengines, wind turbines, and lithium-ion batteries. The results demonstrate that significant performance improvement can be achieved in long-term degradation progress and RUL prediction tasks.

13 January 2014 in IEEE Transactions on Instrumentation and Measurement
Verified
Journal Article
Closed access
YHYu Huang
Yu Huang
BABruno Ando
Bruno Ando
SBSalvatore Baglio
Salvatore Baglio
This paper reports the numerical and experimental investigation of a bulk and etch silicon on insulator optoelectro-mechanical system realized using a multilayer metal-dielectric photonic bandgap (PBG) structure. A specific optical structure is designed, which embeds an air gap; the acceleration to be measured induces displacements into a proof mass that in turn are transduced as variations in the optical reflectance spectrum of the PBG stack. The PBG optical stack is made of metals and dielectrics. Because of the large difference in the refractive indexes between these two classes of materials, the resulting optical properties of PBG transparent metals allow for obtaining a sharp change in the output signal even for very small changes of the air gap and therefore of the relative positions of the proof mass. The microelectromechanical system consists of a suspended square-shaped mass supported by four crab-leg beams; the central part is used as active optical area where the light beam is to be focused. The advantages of silicon micromachining combined with PBG properties have been addressed. The sensor proposed has been initially analytically modeled and numerically studied using CoventorWare. Then the device has been fabricated and an extensive experimental campaign has been performed.

29 April 2022 in Ocean Engineering
Verified
Journal Article
Closed access
BFBrittny Freeman
Brittny Freeman
YTYufei Tang
Yufei Tang
YHYu Huang
Yu Huang
JVJames VanZwieten
James VanZwieten

11 August 2022 in Frontiers in Aging Neuroscience
Verified
Journal Article
Open access
SWShuojia Wang
Shuojia Wang
WWWeiren Wang
Weiren Wang
XLXiaowen Li
Xiaowen Li
YLYafei Liu
Yafei Liu
JWJingming Wei
Jingming Wei
YZYanbing Zeng
Yanbing Zeng
Objectives: This study firstly aimed to explore predicting cognitive impairment at an early stage using a large population-based longitudinal survey of elderly Chinese people. The second aim was to identify reversible factors which may help slow the rate of decline in cognitive function over 3 years in the community.Methods: We included 12,280 elderly people from four waves of the Chinese Longitudinal Healthy Longevity Survey (CLHLS), followed from 2002 to 2014. The Chinese version of the Mini-Mental State Examination (MMSE) was used to examine cognitive function. Six machine learning algorithms (including a neural network model) and an ensemble method were trained on data split 2/3 for training and 1/3 testing. Parameters were explored in training data using 3-fold cross-validation and models were evaluated in test data. The model performance was measured by area-under-curve (AUC), sensitivity, and specificity. In addition, due to its better interpretability, logistic regression (LR) was used to assess the association of life behavior and its change with cognitive impairment after 3 years.Results: Support vector machine and multi-layer perceptron were found to be the best performing algorithms with AUC of 0.8267 and 0.8256, respectively. Fusing the results of all six single models further improves the AUC to 0.8269. Playing more Mahjong or cards (OR = 0.49,95% CI: 0.38–0.64), doing more garden works (OR = 0.54,95% CI: 0.43–0.68), watching TV or listening to the radio more (OR = 0.67,95% CI: 0.59–0.77) were associated with decreased risk of cognitive impairment after 3 years.Conclusions: Machine learning algorithms especially the SVM, and the ensemble model can be leveraged to identify the elderly at risk of cognitive impairment. Doing more leisure activities, doing more gardening work, and engaging in more activities combined were associated with decreased risk of cognitive impairment.

3 June 2004
Verified
Conference Paper
Closed access
YHYu Huang
Yu Huang
WCWu-Tung Cheng
Wu-Tung Cheng
CHCheng-Ju Hsieh
Cheng-Ju Hsieh
HTHuan-Yung Tseng
Huan-Yung Tseng
AHAlou Huang
Alou Huang
YHYu-Ting Hung
Yu-Ting Hung

10 October 2023 in Sensors
Verified
Journal Article
Open access
PDF file
AFAngzhi Fan
Angzhi Fan
YHYu Huang
Yu Huang
FXFei Xu
Fei Xu
SBSthitie Bom
Sthitie Bom
The semiconductor industry is one of the most technology-evolving and capital-intensive market sectors. Effective inspection and metrology are necessary to improve product yield, increase product quality and reduce costs. In recent years, many types of semiconductor manufacturing equipments have been equipped with sensors to facilitate real-time monitoring of the production processes. These production-state and equipment-state sensor data provide an opportunity to practice machine-learning technologies in various domains, such as anomaly/fault detection, maintenance scheduling, quality prediction, etc. In this work, we focus on the soft-sensing regression problem in metrology systems, which uses sensor data collected during wafer processing steps to predict impending inspection measurements that used to be measured in wafer inspection and metrology systems. We proposed a regressor based on Long Short-term Memory network and devised two distinct loss functions for the purpose of the training model. Although the assessment of our prediction errors by engineers is subjective, a novel piece-wise evaluation metric was introduced to evaluate model accuracy in a mathematical way. Our experimental results showcased that the proposed model is capable of achieving both accurate and early prediction across various types of inspections in complicated manufacturing processes.