Zhen Liu received his BS and MS degrees in electrical engineering in 1999 and 2002, and his PhD in detection technology and automatic equipment in 2007, all from Northwestern Polytechnical University (NPU), Xi’an, China. Since 2007, he has been working at the University of Electronic Science and Technology of China (UESTC), Chengdu, China, where he is currently a Professor of the Department of Instrument Science and Technology at the School of Automation Engineering. From December 2013 to January 2015, he was a visiting scholar in the Department of Statistics and Applied Probability, University of California—Santa Barbara, CA, USA. Currently, he is the assistant to the Dean and the Deputy Director of the Department of the School of Automation Engineering at UESTC, the Research Director of PHM (Prognostics and Health Management) laboratory of electronic testing technology and instruments engineering research center of the ministry of education of China, and an IEEE member. His research interests include testability analysis, fault diagnosis, fault prediction, and lifetime estimate technology based on machine learning for electronic systems.