Kan Kan

Mr. Kan Kan

Scientific Research, South China National Centre of Metrology, Guangzhou, Guangdong, China
orcid

Research Focus & Metrics

Academic Career Length

29Years (1998-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 October 1998 in Electronics Letters
Verified
Journal Article
Closed access
KKKan Kan
Kan Kan
PWPo Keung Wong
Po Keung Wong
A novel algorithm for the synthesis of wavelet networks is proposed which possesses the self-construction capability. It is referred as recursive variance suppression growth. Using this method, the network is allowed to start with a null hidden neuron and then grows autonomously. Simulations show that the proposed method outperforms other reported methods.

14 October 2024 in Sensors
Verified
Journal Article
Open access
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KKKan Kan
Kan Kan
SWShuaizhe Wang
Shuaizhe Wang
Zilong LiuZilong Liu
Zilong Liu
Xingchuang XiongXingchuang Xiong
Xingchuang Xiong
The digital transformation of metrology is one of the most active activities in the field of metrology at present, where the digital calibration certificate (DCC) being developed is the topic receiving the most concern in the current digital transformation. In practical industrial applications, the issue of storage carrier for the DCC plays a crucial role in its promotion and implementation. To address this issue, a DCC meta-model called DCC-Lite schema has been designed along with a corresponding processing method. This solution involves compressing and segmenting the DCC to make it suitable for storage using RFID tags. These RFID tags are affixed to the instruments and accompany them throughout their usage. Additionally, the DCC-RFID processing system has been developed to validate the effectiveness of the DCC meta-model and its corresponding processing method within a wireless temperature acquisition system. Experimental results demonstrate that the system successfully reads and writes the DCC stored within the RFID tag group. Furthermore, it enables automated parsing of the DCC calibration data by the machine and real-time compensation of measurement data to reduce measurement errors.