Dehua Zheng

Dehua Zheng


Research Focus & Metrics

Academic Career Length

4Years (2023-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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12 November 2023 in Sensors
Verified
Journal Article
Open access
PDF file
SLSiyuan Li
Siyuan Li
DZDehua Zheng
Dehua Zheng
DYDongjie Yue
Dongjie Yue
CHChuang Hu
Chuang Hu
XMXinjiang Ma
Xinjiang Ma
Three-dimensional laser scanning has emerged as a prevalent measurement method in numerous high-precision applications, and the precision of the obtained data is closely related to the intensity information. Comprehending the association between intensity and point cloud accuracy facilitates scanner performance assessment, optimization of data acquisition strategies, and evaluation of point cloud precision, thereby ensuring data reliability for high-precision applications. In this study, we investigated the correlation between point cloud accuracy and two distinct types of intensity information. In addition, we presented methods for assessing point cloud accuracy using these two forms of intensity information, along with their applicable scopes. By examining the percentage intensity, we analyzed the reflectance properties of the scanned object’s surface employing the Lambertian model. Our findings indicate that the Lambertian circle fitting radius is inversely correlated with the scanner’s ranging error at a constant scanning distance. Experimental outcomes substantiate that modifying the surface characteristics of the object enables the attainment of higher-precision point cloud data. By constructing a model associating the raw reflectance intensity with ranging errors, we developed a single-point error ellipsoid model to assess the accuracy of individual points within the point cloud. The experiments revealed that the ranging error model based on the raw intensity is solely applicable to point cloud data unaffected by specular reflectance properties. Moreover, the devised single-point error ellipsoid model accurately evaluates the measurement error of individual points. Both analytical methods can be utilized to evaluate the performance of the scanner as well as the accuracy of the acquired point cloud data, providing reliable data support for various high-precision applications.