Xiaofeng Zhang

Dr. Xiaofeng Zhang


Research Focus & Metrics

Academic Career Length

6Years (2021-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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29 November 2023 in Coatings
Verified
Journal Article
Open access
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XZXiaofeng Zhang
Xiaofeng Zhang
GZGuanli Zhang
Guanli Zhang
YYYue Yan
Yue Yan
Transparent conducting films on polymeric substrates are increasingly applied in diverse novel displays and flexible electronics. In this paper, indium tin oxide films on polymeric substrates were deposited by magnetron sputtering using ceramic targets with different doping ratios. These films were characterized by X-ray photoelectron spectroscopy, X-ray diffractometer, atomic force microscopy, spectroscopic ellipsometry, spectrophotometer, sheet resistance meter, and the Hall effect measurement. In terms of transparency and conductivity, the results have shown that the doping ratio played a less important role in determining the optical properties, while the electrical properties were significantly influenced. It was found that, when the thickness was less than 130 nm, these films with the nominal doping ratio of 95:5 (wt. %) demonstrated higher electrical conductivity compared to those with 90:10 (wt. %), which were widely used in industry. Therefore, for the flexible polymeric substrate, the target with a doping ratio of 95:5 (wt. %) could be suitable to achieve high electrical conductivity.

6 April 2021 in Materials
Verified
Journal Article
Open access
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YMYibo Ma
Yibo Ma
XZXiaofeng Zhang
Xiaofeng Zhang
WLWeiming Liu
Weiming Liu
YWYouxiu Wei
Youxiu Wei
ZFZiyi Fu
Ziyi Fu
YYYue Yan
Yue Yan
A batch of Sn oxides was fabricated by pulse direct current reactive magnetron sputtering (pDC−RMS) using different Ar/O2 flow ratios at 0.3 Pa; the influence of stoichiometry on the physical and electrochemical properties of the films was evaluated by the characterization of scanning electron microscope (SEM), X-ray diffraction (XRD), X-ray reflection (XRR), X-ray photoelectron spectroscopy (XPS) and more. The results were as follows. First, the film surface transitioned from a particle morphology (roughness of 50.0 nm) to a smooth state (roughness of 3.7 nm) when Ar/O2 flow ratios changed from 30/0 to 23/7; second, all SnOx films were in an amorphous state, some samples deposited with low O2 flow ratios (≤2 sccm) still included metallic Sn grains. Therefore, the stoichiometry of SnOx calculated by XPS spectra increased linearly from SnO0.0.08 to SnO1.71 as the O2 flow ratios increased, and the oxidation degree was further calibrated by the average valence method and SnO2 standard material. Finally, the electrochemical performance was confirmed to be improved with the increase in oxidation degree (x) in SnOx, and the SnO1.71 film deposited with Ar/O2 = 23/7 possessed the best cycle performance, reversible capacity of 396.1 mAh/g and a capacity retention ratio of 75.4% after 50 cycles at a constant current density of 44 μA/cm2.