Terapascal static pressure generation is enabled in laboratory due to implementation of nanocrystralline diamond microballs.

This paper reports a special device called a `speckle suppressor', which contains a highly porous nanoberyllium plate squeezed between two beryllium windows. The insertion of the speckle suppressor in an X-ray beam allows manipulation of the spatial coherence length, thus changing the effective source size and removing the undesirable speckle structure in X-ray imaging experiments almost without beam attenuation. The absorption of the nanoberyllium plate is below 1% for 1 mm thickness at 12 keV. The speckle suppressor was tested on the ID06 ESRF beamline with X-rays in the energy range from 9 to 15 keV. It was applied for the transformation of the phase–amplitude contrast to the pure amplitude contrast in full-field microscopy.

An X-ray amplitude-splitting interferometer based on compound refractive lenses, which operates in the reflection mode, is proposed and realized. The idea of a reflecto-interferometer is to use a very simplified experimental setup where a focused X-ray beam reflected from parallel flat surfaces creates an interference pattern in a wide angular range. The functional capabilities of the interferometer were experimentally tested at the European Synchrotron Radiation Facility (ESRF) ID06 beamline in the X-ray energy range from 10 keV to 15 keV. The main features of the proposed approach, high spatial and temporal resolution, were demonstrated experimentally. The reflections from free-standing Si₃N₄ membranes, gold and resist layers were studied. Experimentally recorded interferograms are in good agreement with our simulations. The main advantages and future possible applications of the reflecto-interferometer are discussed.