Recent methods for deep metric learning have been focusing on designing different contrastive loss functions between positive and negative pairs of samples so that the learned feature embedding is able to pull positive samples of the same class closer and push negative samples from different classes away from each other. In this work, we recognize that there is a significant semantic gap between features at the intermediate feature layer and class labels at the final output layer. To bridge this gap, we develop a contrastive Bayesian analysis to characterize and model the posterior probabilities of image labels conditioned by their features similarity in a contrastive learning setting. This contrastive Bayesian analysis leads to a new loss function for deep metric learning. To improve the generalization capability of the proposed method onto new classes, we further extend the contrastive Bayesian loss with a metric variance constraint. Our experimental results and ablation studies demonstrate that the proposed contrastive Bayesian metric learning method significantly improves the performance of deep metric learning in both supervised and pseudo-supervised scenarios, outperforming existing methods by a large margin.

Deep feature embedding aims to learn discriminative features or feature embeddings for image samples which can minimize their intra-class distance while maximizing their inter-class distance. Recent state-of-the-art methods have been focusing on learning deep neural networks with carefully designed loss functions. In this work, we propose to explore a new approach to deep feature embedding. We learn a graph neural network to characterize and predict the local correlation structure of images in the feature space. Based on this correlation structure, neighboring images collaborate with each other to generate and refine their embedded features based on local linear combination. Graph edges learn a correlation prediction network to predict the correlation scores between neighboring images. Graph nodes learn a feature embedding network to generate the embedded feature for a given image based on a weighted summation of neighboring image features with the correlation scores as weights. Our extensive experimental results under the image retrieval settings demonstrate that our proposed method outperforms the state-of-the-art methods by a large margin, especially for top-1 recalls.

In this study, we develop a new approach, called zero-shot learning to index on semantic trees (LTI-ST), for efficient image indexing and scalable image retrieval. Our method learns to model the inherent correlation structure between visual representations using a binary semantic tree from training images which can be effectively transferred to new test images from unknown classes. Based on predicted correlation structure, we construct an efficient indexing scheme for the whole test image set. Unlike existing image index methods, our proposed LTI-ST method has the following two unique characteristics. First, it does not need to analyze the test images in the query database to construct the index structure. Instead, it is directly predicted by a network learnt from the training set. This zero-shot capability is critical for flexible, distributed, and scalable implementation and deployment of the image indexing and retrieval services at large scales. Second, unlike the existing distance-based index methods, our index structure is learnt using the LTI-ST deep neural network with binary encoding and decoding on a hierarchical semantic tree. Our extensive experimental results on benchmark datasets and ablation studies demonstrate that the proposed LTI-ST method outperforms existing index methods by a large margin while providing the above new capabilities which are highly desirable in practice.