Youzhi Xu

Mr. Youzhi Xu

orcid

Research Focus & Metrics

Academic Career Length

4Years (2023-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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28 May 2024 in Sensors
Verified
Journal Article
Open access
PDF file
LYLiu Yulong
Liu Yulong
HWHao Wu
Hao Wu
YXYouzhi Xu
Youzhi Xu
XLXiaoming Liu
Xiaoming Liu
XYXiujuan Yu
Xiujuan Yu
In order to improve the efficiency and accuracy of multitarget detection of soldering defects on surface-mounted components in Printed Circuit Board (PCB) fabrication, we propose a sample generation method using Stable Diffusion Model and ControlNet, as well as a defect detection method based on the Swin Transformer. The method consists of two stages: First, high-definition original images collected in industrial production and the corresponding prompts are input to Stable Diffusion Model and ControlNet for automatic generation of nonindependent samples. Subsequently, we integrate Swin Transformer as the backbone into the Cascade Mask R-CNN to improve the quality of defect features extracted from the samples for accurate detection box localization and segmentation. Instead of segmenting individual components on the PCB, the method inspects all components in the field of view simultaneously over a larger area. The experimental results demonstrate the effectiveness of our method in scaling up nonindependent sample datasets, thereby enabling the generation of high-quality datasets. The method accurately recognizes targets and detects defect types when performing multitarget inspection on printed circuit boards. The analysis against other models shows that our improved defect detection and segmentation method improves the Average Recall (AR) by 2.8% and the mean Average Precision (mAP) by 1.9%.

4 June 2025 in Sensors
Verified
Journal Article
Open access
PDF file
YXYouzhi Xu
Youzhi Xu
HWHao Wu
Hao Wu
LYLiu Yulong
Liu Yulong
XZXing Zhang
Xing Zhang
Printed circuit board (PCB) assembly, on the basis of surface mount electronic component welding, is one of the most important electronic assembly processes, and its defect detection is also an important part of industrial generation. The traditional two-stage target detection algorithm model has a large number of parameters and the runtime is too long. The single-stage target detection algorithm has a faster running time, but the detection accuracy needs to be improved. To solve this problem, we innovated and modified the YOLO11n model. Firstly, we used the Retention Block (RetBlock) to improve the C3K2 module in the backbone, creating the RetC3K2 module, which makes up for the limitation of the original module’s limited, purely convolutional local receptive field. Secondly, the neck structure of the original model network is fused with a Multi-Branch Auxiliary Feature Pyramid Network (MAFPN) structure and turned into a multi-branch auxiliary neck network, which enhances the model’s ability to fuse multiple scaled characteristics and conveys diverse information about the gradient for the output layer. The improved YOLO11n model improves its mAP50 by 0.023 (2.5%) and mAP75 by 0.026 (2.8%) in comparison with the primitive model network, and detection precision is significantly improved, proving the superiority of our proposed approach.

26 February 2025 in Micromachines
Verified
Journal Article
Open access
PDF file
YXYouzhi Xu
Youzhi Xu
HWHao Wu
Hao Wu
LYLiu Yulong
Liu Yulong
XLXiaoming Liu
Xiaoming Liu
Soldering of printed circuit board (PCB)-based surface-mounted assemblies is a critical process, and to enhance the accuracy of detecting their multi-targeted soldering defects, we propose an automated sample generation method that combines ControlNet and a Stable Diffusion Model. This method can expand the dataset by quickly obtaining sample images with high quality containing both defects and normal detection targets. Meanwhile, we propose the Cascade Mask R-CNN model with ConvNeXt as the backbone, which performs well in dealing with multi-target defect detection tasks. Unlike previous detection methods that can only detect a single component, it can detect all components in the region. The results of the experiment demonstrate that the detection accuracy of our proposed approach is significantly enhanced over the previous convolutional neural network model, with an increase of more than 10.5% in the mean accuracy precision (mAP) and 9.5% in the average recall (AR).

18 December 2023 in Electronics
Verified
Journal Article
Open access
PDF file
HWHao Wu
Hao Wu
LYLiu Yulong
Liu Yulong
YXYouzhi Xu
Youzhi Xu
When applying deep learning methods to detect micro defects on low-contrast LCD surfaces, there are challenges related to imbalances in sample datasets and the complexity and laboriousness of annotating and acquiring target image masks. In order to solve these problems, a method based on sample and mask auto-generation for deep generative network models is proposed. We first generate an augmented dataset of negative samples using a generative adversarial network (GAN), and then highlight the defect regions in these samples using the training method constructed by the GAN to automatically generate masks for the defect images. Experimental results demonstrate the effectiveness of our proposed method, as it can simultaneously generate liquid crystal image samples and their corresponding image masks. Through a comparative experiment on the deep learning method Mask R-CNN, we demonstrate that the automatically obtained image masks have high detection accuracy.

12 December 2023 in Preprints.org
Verified
Preprint
Open access
PDF file
HWHao Wu
Hao Wu
LYLiu Yulong
Liu Yulong
YXYouzhi Xu
Youzhi Xu
When applying deep learning methods to detect micro defects on low-contrast LCD surfaces, there are challenges related to the imbalance in samples dataset, as well as the complexity and laboriousness of annotating and acquiring target image masks. In order to solve these problems, a method based on sample and mask auto-generation for deep generative network models is proposed. We first generate an augmented dataset of negative samples using a generative adversarial network(GAN), and then highlight the defect regions in these samples using the training method constructed by the GAN to generate masks for the defect images automatically. Experimental results shows the effectiveness of our proposed method, as it allows for the simultaneous generation of LCD image samples and their corresponding image masks. Through a comparative experiment on the deep learning method Mask R-CNN, we demonstrate that the automatically obtained image masks have high detection accuracy.