Heung Soap Choi

Prof. Dr. Heung Soap Choi

orcid

Research Focus & Metrics

Academic Career Length

14Years (2013-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 June 2014 in ETRI Journal
Verified
Journal Article
Open access
PDF file
YEYong-Sung Eom
Yong-Sung Eom
JSJi-Hye Son
Ji-Hye Son
Keon-Soo JangKeon-Soo Jang
Keon-Soo Jang
HLHak-Sun Lee
Hak-Sun Lee
HBHyun-Cheol Bae
Hyun-Cheol Bae
Heung Soap ChoiHeung Soap Choi
Heung Soap Choi
For the fine-pitch application of flip-chip bonding with semiconductor packaging, fluxing and hybrid underfills were developed. A micro-encapsulated catalyst was adopted to control the chemical reaction at room and processing temperatures. From the experiments with a differential scanning calorimetry and viscometer, the chemical reaction and viscosity changes were quantitatively characterized, and the optimum type and amount of micro-encapsulated catalyst were determined to obtain the best pot life from a commercial viewpoint. It is expected that fluxing and hybrid underfills will be applied to fine-pitch flip-chip bonding processes and be highly reliable.

1 August 2013 in ETRI Journal
Verified
Journal Article
Open access
PDF file
YEYong-Sung Eom
Yong-Sung Eom
JSJi‐Hye Son
Ji‐Hye Son
HBHyun‐Cheol Bae
Hyun‐Cheol Bae
KCKwang‐Seong Choi
Kwang‐Seong Choi
Heung Soap ChoiHeung Soap Choi
Heung Soap Choi
For the formation of solder bumps with a fine pitch of 130 μm on a printed circuit board substrate, low-volume solder on pad (LVSoP) technology using a maskless method is developed for SAC305 solder with a high melting temperature of 220°C. The solder bump maker (SBM) paste and its process are quantitatively optimized to obtain a uniform solder bump height, which is almost equal to the height of the solder resist. For an understanding of chemorheological phenomena of SBM paste, differential scanning calorimetry, viscosity measurement, and physical flowing of SBM paste are precisely characterized and observed during LVSoP processing. The average height of the solder bumps and their maximum and minimum values are 14.7 μm, 18.3 μm, and 12.0 μm, respectively. It is expected that maskless LVSoP technology can be effectively used for a fine-pitch interconnection of a Cu pillar in the semiconductor packaging field.