Advances in manufacturing process technology are key ensembles for the production of integrated circuits in the sub-micrometer region. It is of paramount importance to assess the effects of tolerances in the manufacturing process on the performance of modern integrated circuits. The polynomial chaos expansion has emerged as a suitable alternative to standard Monte Carlo-based methods that are accurate, but computationally cumbersome. This paper provides an overview of the most recent developments and challenges in the application of polynomial chaos-based techniques for uncertainty quantification in integrated circuits, with particular focus on high-dimensional problems.

Non-charge-based logic devices are promising candidates for the replacement of conventional complementary metal-oxide semiconductors (CMOS) devices. These devices utilize magnetic properties to store or process information making them power efficient. Traditionally, to fully characterize the input-output behavior of these devices a large number of micromagnetic simulations are required, which makes the process computationally expensive. Machine learning techniques have been shown to dramatically decrease the computational requirements of many complex problems. We use state-of-the-art data-efficient machine learning techniques to expedite the characterization of their behavior. Several intelligent sampling strategies are combined with machine learning (binary and multi-class) classification models. These techniques are applied to a magnetic logic device that utilizes direct exchange interaction between two distinct regions containing a bistable canted magnetization configuration. Three classifiers were developed with various adaptive sampling techniques in order to capture the input-output behavior of this device. By adopting an adaptive sampling strategy, it is shown that prediction accuracy can approach that of full grid sampling while using only a small training set of micromagnetic simulations. Comparing model predictions to a grid-based approach on two separate cases, the best performing machine learning model accurately predicts 99.92% of the dense test grid while utilizing only 2.36% of the training data respectively.