We report on numerical modelling of three-dimensional lattice structures designed to provide phononic bandgaps. The examined lattice structures rely on two distinct mechanisms for bandgap formation: the destructive interference of elastic waves and internal resonance. Further to the effect of lattice type on the development of phononic bandgaps, we also present the effect of volume fraction, which enables the designer to control the frequency range over which the bandgaps exist. The bandgaps were identified from dispersion curves obtained using a finite element wave propagation modelling technique that provides high computational efficiency and high wave modelling accuracy. We show that lattice structures employing internal resonance can provide transmissibility reduction of longitudinal waves of up to −103 dB. Paired with the manufacturing freedom and material choice of additive manufacturing, the examined lattice structures can be tailored for use in wide-ranging applications including machine design, isolation and support platforms, metrology frames, aerospace and automobile applications, and biomedical devices.
30 July 2020 in The International Journal of Advanced Manufacturing Technology
Fast and accurate in-line areal surface topography measuring instruments are required to control the quality of microscale manufactured components, without significantly slowing down the production process. Full-field areal optical surface topography measurement instruments are promising for in-line or on-machine measurement applications due to their ability to measure quickly, to access small features and to avoid surface damage. This paper presents the development and integration of a compact optical focus variation sensor for on-machine surface topography measurement mounted on to a hybrid ultraprecision machine tool. The sensor development is described and a case study involving the on-machine dimensional measurement of the depth of hydrophobic microscale features, including microchannels and micro-dimples, is presented. Comparisons of results between the on-machine measurements obtained by the developed sensor and a desktop focus variation microscope are presented and discussed. The comparison results show that the developed focus variation sensor is able to perform on-machine dimensional measurement of microscale features within sub-micrometre accuracy.
Light spectrum dispersion is an exciting subjectin science because of its beautiful atmospheric colour phenomenon which attracts students. However, to see the phenomenon is not easy since it needs a spectrometer, which is commonly expensive. Therefore, the present study aims to describe a low-cost spectrometer for investigating lighting spectrum and analysing the purity of honey as a pedagogical students’ project. The spectrometer was constructed from a webcam connected to a laptop, a free spectrometer software, DVD disk, and black cardboard. The calibration of the developed spectrometer used an Argon (Ar) lamp. Afterwards, measurement tests were carried out by using Neon (Ne) and Xenon (Xe) lamps. A white light-emitting diode was used as a light source to measure several types of honey wavelengths. The results from the experiment show that the wavelength of Ar, Ne, and Xe are (503 ± 4) nm, (463 ± 3) nm, and (451 ± 3) nm respectively. The measurement accuracy of the spectrometer is 99.5%. In addition, the commercial honey characterisations show that pure honey tends to have an excellent and smooth spectrum with one peak. On the contrary, the adulteries honeys show a rough wave with many peaks representing the inhomogeneous ingredients. It is found that the average accuracy for honey spectrum is 99.8%. Moreover, the low-cost spectrometer can be built and used easily by students for educational purposes.