Polarization-sensitive (PS) terahertz (THz) technology can be used for investigating anisotropic materials that are opaque for visible light. A full characterization of an anisotropic material requires the extraction of the birefringence as well as the orientation of the optical axis from the measurement data. We present an approach based on THz time-domain spectroscopy (TDS) that exploits the spectral content of the THz signal for determining these two parameters from only two measurements. In contrast to an earlier approach with a more sophisticated PS-THz system and quasi-circularly polarized THz radiation, now a simple standard THz-TDS system can be employed. After a description of the mathematical model for data analysis we demonstrate the applicability of our method for a lithium niobate crystal and furthermore for a glass-fiber reinforced polymer sample, for which the orientation of the optical axis and birefringence are obtained in a spatially resolved way, showing the potential of the method also for PS-THz imaging. As no specialized setup or components are required, our approach can be easily and extensively applied for the analysis of anisotropic samples at THz frequencies.

Terahertz time-domain spectroscopy is a useful technique to characterize layered samples and thin films. It gives access to their optical properties and thickness. Such measurements are done in transmission, which requires access to the sample from opposite sides. In reality this is not always possible. In such cases, reflection measurements are the only option, but they are more difficult to implement. Here we propose a method to characterize films in reflection geometry using a polarimetric approach based on the identification of Brewster angle and modeling of the measured signal to extract the refractive index and thickness of the sample. The technique is demonstrated experimentally on an unsupported single layer thin film sample. The extracted optical properties and thickness were in good agreement with established transmission terahertz spectroscopy measurements. The new method has the potential to cover a wide range of applications, both for research and industrial purposes.

Terahertz (THz) is an emerging technology particularly well suited for the non-destructive investigation of inner structures in polymers. To realize its full potential, THz imaging systems adapted to industrial constraints as well as more application studies in areas of interest are needed. In this work, we present a fast and flexible THz imaging system comprising hardware and software and demonstrate its capabilities for the investigation of defects in glass fiber-reinforced polymers (GFRPs), particularly for the detection of drilling-induced delaminations. Measurement data obtained by raster scanning of GFRP samples are gathered in 3D volumetric images. THz images of the drilled holes are then compared to reference images of the same holes obtained from X-ray computed tomography measurements. We show that THz imaging is capable of identifying not only artificial defects in the form of aluminum and Teflon inlays, but also real defects such as delaminations generated by drilling operations, and is suitable for non-destructive testing in industrial conditions.