It has been clarified that the distribution of peak EQE values over wavelengths in the range of currents 0.1 − 1000 mA in InGaN/GaN MQW contains information on the In distribution. The correlation has been found between the EQE values of green polar InGaN/GaN LEDs and the In distribution and redistribution in InGaN/GaN MQW under the influence of growth conditions, accelerated aging, and electron irradiation.

We study recombination processes in nitride LEDs emitting from 270 to 540 nm with EQE ranging from 4% to 70%. We found a significant correlation between the LEDs’ electro-optical properties and the degree of nanomaterial disorder (DND) in quantum wells (QWs) and heterointerfaces. DND depends on the nanoarrangement of domain structure, random alloy fluctuations, and the presence of local regions with disrupted alloy stoichiometry. The decrease in EQE values is attributed to increased DND and excited defect (ED) concentrations, which can exceed those of Shockley–Read–Hall defects. We identify two mechanisms of interaction between EDs and charge carriers that lead to a narrowing or broadening of electroluminescence spectra and increase or decrease EQE, respectively. Both mechanisms involve multiphonon carrier capture and ionization, impacting EQE reduction and efficiency droop. The losses caused by these mechanisms directly affect EQE dependencies on current density and the maximum EQE values for LEDs, regardless of the emission wavelength. Another manifestation of these mechanisms is the reversibility of LED degradation. Recombination processes vary depending on whether QWs are within or outside the space charge region of the p-n junction.

A decrease in external quantum efficiency (EQE) of commercial LEDs based on MQW InGaN/GaN at wavelengths of 445, 530 and MQW AlGaN/GaN at 280 nm was experimentally studied in the standard aging mode at direct current. The decrease in EQE (regardless of the radiation wavelength) is found out to occur due to cooperative phenomena developing in 1–2 quantum wells (QWs) located in the space charge region (SCR) around the p–n junction, as well as in most of the QWs outside of SCR. It is shown that the inhomogeneous flow of current in these regions leads not only to the transformation of defects localized at heteroboundaries in the SCR and in lateral inhomogeneities in the alloy composition outside of SCR as well as in the extended defects, but also to a change in the alloy composition.