Charles Berger

Prof. Dr. Charles Berger

orcid

Research Focus & Metrics

Academic Career Length

33Years (1994-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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21 January 1998 in Analytical Chemistry
Verified
Journal Article
Closed access
CBCharles Berger
Charles Berger
TBTom A. M. Beumer
Tom A. M. Beumer
RKRob P. H. Kooyman
Rob P. H. Kooyman
JGJan Greve
Jan Greve

1 September 1994 in Review of Scientific Instruments
Verified
Journal Article
Closed access
PDF file
CBCharles Berger
Charles Berger
RKRob P. H. Kooyman
Rob P. H. Kooyman
JGJan Greve
Jan Greve
In this article we demonstrate how to obtain the ultimate lateral resolution in surface plasmon microscopy (SPM) (diffraction limited by the objective). Surface plasmon decay lengths are determined theoretically and experimentally, for wavelengths ranging from 531 to 676 nm, and are in good agreement. Using these values we can determine for each particular situation which wavelength should be used to obtain an optimal lateral resolution, i.e., where the plasmon decay length does not limit the resolution anymore. However, there is a trade‐off between thickness resolution and lateral resolution in SPM. Because of the non‐optimal thickness resolution, we use several techniques to enhance the image acquisition and processing. Without these techniques the use of short wavelengths results in images where the contrast has vanished almost completely. In an example given, a 2.5 nm SiO2 layer on a gold layer is imaged with a lateral resolution of 2 μm, and local reflectance curves are measured to determine the layer thickness. The SPM image is compared with an atomic force microscopy image of the same object. We obtain a 3 μm resolution when thickness differences within a lipid monolayer are imaged and measured.

1 September 2011
Verified
Conference Paper
Closed access
MLMarcus Liwicki
Marcus Liwicki
MMMuhammad Imran Malik
Muhammad Imran Malik
CHC. Elisa van Den Heuvel
C. Elisa van Den Heuvel
XCXiaohong Chen
Xiaohong Chen
CBCharles Berger
Charles Berger
BFBryan Found
Bryan Found
The Netherlands Forensic Institute and the Institute for Forensic Science in Shanghai are in search of a signature verification system that can be implemented in forensic casework and research to objectify results. We want to bridge the gap between recent technological developments and forensic casework. In collaboration with the German Research Center for Artificial Intelligence we have organized a signature verification competition on datasets with two scripts (Dutch and Chinese) in which we asked to compare questioned signatures against a set of reference signatures. We have received 12 systems from 5 institutes and performed experiments on online and offline Dutch and Chinese signatures. For evaluation, we applied methods used by Forensic Handwriting Examiners (FHEs) to assess the value of the evidence, i.e., we took the likelihood ratios more into account than in previous competitions. The data set was quite challenging and the results are very interesting.

1 March 2011 in Science & Justice
Verified
Journal Article
Closed access
CAColin Aitken
Colin Aitken
CBCharles Berger
Charles Berger
JBJohn S. Buckleton
John S. Buckleton
CCChristophe Champod
Christophe Champod
JCJames Curran
James Curran
GZGrzegorz Zadora
Grzegorz Zadora

1 June 2011 in Science & Justice
Verified
Journal Article
Closed access
CBCharles Berger
Charles Berger
JBJohn Buckleton
John Buckleton
CCChristophe Champod
Christophe Champod
IEIan W. Evett
Ian W. Evett
GJGraham Jackson
Graham Jackson

1 November 1995 in Langmuir
Verified
Journal Article
Closed access
CBCharles Berger
Charles Berger
KWK. O. van der Werf
K. O. van der Werf
RKR. P. H. Kooyman
R. P. H. Kooyman
BGB. G. de Grooth
B. G. de Grooth
JGJ. Greve
J. Greve