Dislocation-free vertical GaN pillars in nanoscale were grown on Si (111) surface through self-assembly by molecular-beam epitaxy. No extra catalytic or nanostructural assistance has been employed. These nanorods have a lateral dimension from ≲10 nm to ∼800 nm and a height of ≲50 nm to ≳3 μm protruding above the film, depending on the growth parameters. The top view of the nanorods has a hexagonal shape from scanning electron microscopy. Transmission electron microscopy shows that the nanorods are hexagonal, single crystal GaN along the c-axis. An extra peak at 363 nm originated from nanorods was observed in photoluminescence spectra at 66 K, which is ascribed to the surface states according to the results of surface passivation. Micro-Raman spectroscopy on a single nanorod reveals ${\mathrm{E}}_1$ and ${\mathrm{E}}_2$ modes at 559.0 and 567.4 cm⁻¹, respectively. Large strain was observed in both the transmission electron micrograph and the Raman shift. A possible growth mechanism is discussed.

Conversion of mechanical energy into electric energy has been demonstrated in GaN nanorods. The measurement was achieved by deflecting GaN nanorods with a conductive atomic force microscope PtIr tip in contact. The mechanism relies on the coupling between piezoelectric and semiconducting properties in GaN nanorod, which creates a strain field and drives the charge flow across the nanorod. The result shown here opens up an opportunity for harvesting electricity from wasted mechanical energies in the ambient environment, which may lead to the realization of self-powered nanodevices.

The self-induced formation of core-shell InAlN nanorods (NRs) is addressed at the mesoscopic scale by density functional theory (DFT)-resulting parameters to develop phase field modeling (PFM). Accounting for the structural, bonding, and electronic features of immiscible semiconductor systems at the nanometer scale, we advance DFT-based procedures for computation of the parameters necessary for PFM simulation runs, namely, interfacial energies and diffusion coefficients. The developed DFT procedures conform to experimental self-induced InAlN NRs' concerning phase-separation, core/shell interface, morphology, and composition. Finally, we infer the prospects for the transferability of the coupled DFT-PFM simulation approach to a wider range of nanostructured semiconductor materials.

We report a direct determination of the specular scattering probability of acoustic phonons at a crystal boundary by observing the escape of incident coherent phonons from the coherent state during reflection. In the sub-THz frequency range where the phonon wavelength is much longer than the lattice constant, the acoustic phonon-interface interaction is found to agree well with the macroscopic theory on wave scattering from rough surfaces. This examination thus quantitatively verifies the dominant role of atomic-scale corrugations in the Kapitza anomaly observed at 1–10 K and further opens a new path to nondestructively estimate subnanoscale roughness of buried interfaces.