Electric fields inside guided-mode resonance filters (GMRFs) may be intensified by resonance effects. The electric field enhancement is investigated in two GMRFs: one is resonant at normal incidence, the other at oblique incidence. It is shown that the two GMRFs exhibit different behaviors in their electric enhancement. Differences between the electric field distributions of the two GMRFs arise because coupling between counterpropagating modes occurs in the first case. It is also shown that the order of the electric field of maximum amplitude can be controlled by modulation of the dielectric constant of the grating.

A model of plasma formation induced by UV nanosecond pulse-laser interaction with SiO₂ thin film based on nanoabsorber is proposed. The model considers the temperature dependence of band gap. The numerical results show that during the process of nanosecond pulsed-laser interaction with SiO₂ thin film, foreign inclusion which absorbs a fraction of incident radiation heats the surrounding host material through heat conduction causing the decrease of the band gap and consequently, the transformation of the initial transparent matrix into an absorptive medium around the inclusion, thus facilitates optical damage. Qualitative comparison with experiments is also provided.

Phase measuring deflectometry is a powerful measuring method for complex optical surfaces, which captures the reflected fringe images encoded on the screen under the premise of focusing the measured specular surface. Due to the limited depth of field of the camera, the captured images and the measured surface cannot be focused at the same time. To solve the position-angle uncertainty issue, in this Letter, the wavefront coding technology is used to modulate the imaging wavefront of the deflectometry, thereby making the measuring system insensitive to the defocus and other low-order aberration including astigmatism, field curvature, and so on. To obtain the accurate phase, the captured fringe images are deconvoluted using the modulated point spread function to reduce the phase error. Demonstrated with a highly curved spherical surface, the measurement accuracy can be improved by four times. Experiments demonstrate that the proposed method can successfully reconstruct the complex surfaces defocusing the captured images, which can greatly release the focusing requirement and improve measurement accuracy. (C) 2022 Optica Publishing Group

Subaperture polishing is a key technique for fabricating ultra-precision optics. However, the error source complexity in the polishing process creates large fabrication errors with chaotic characteristics that are difficult to predict using physical modelling. In this study, we first proved that the chaotic error is statistically predictable and developed a statistical chaotic-error perception (SCP) model. We confirmed that the coupling between the randomness characteristics of chaotic error (expectation and variance) and the polishing results follows an approximately linear relationship. Accordingly, the convolution fabrication formula based on the Preston equation was improved, and the form error evolution in each polishing cycle for various tools was quantitatively predicted. On this basis, a self-adaptive decision model that considers the chaotic-error influence was developed using the proposed mid- and low-spatial-frequency error criteria, which realises the automatic decision of the tool and processing parameters. An ultra-precision surface with equivalent accuracy can be stably realised via proper tool influence function (TIF) selection and modification, even for low-deterministic level tools. Experimental results indicated that the average prediction error in each convergence cycle was reduced to 6.14%. Without manual participation, the root mean square(RMS) of the surface figure of a ϕ100-mm flat mirror was converged to 1.788 nm with only robotic small-tool polishing, and that of a ϕ300-mm high-gradient ellipsoid mirror was converged to 0.008 λ. Additionally, the polishing efficiency was increased by 30% compared with that of manual polishing. The proposed SCP model offers insights that will help achieve advancement in the subaperture polishing process.