Thin films of BaM hexaferrite (BaFe₁₂O₁₉) were grown on α-Al₂O₃(0001) substrates by laser molecular beam epitaxy. Structural, magnetic, and magneto-optical properties were studied using medium-energy ion scattering, energy dispersive X-ray spectroscopy, atomic force microscopy, X-ray diffraction, magneto-optical spectroscopy, and magnetometric techniques, and the dynamics of magnetization by ferromagnetic resonance method. It was shown that even a short time annealing drastically changes the structural and magnetic properties of films. Only annealed films demonstrate magnetic hysteresis loops in PMOKE and VSM experiments. The shape of hysteresis loops depends on thickness of films showing practically rectangular loops and high value of remnant magnetization (M_r/M_s~99%) for thin films (50 nm) and much broader and sloped loops in thick (350–500 nm) films. The magnitude of magnetization 4πM_s ≈ 4.3 kG in thin films corresponds to that in bulk BaM hexaferrite. Photon energy and sign of bands in magneto-optical spectra of thin films correspond to ones observed earlier in bulk samples and films of BaM hexaferrite. FMR spectra of 50 nm films at 50 GHz consist of a number of narrow lines. The width of main line ΔH~20 Oe is lower than has been reported up to now.

Thin (~50 nm thick) BaM hexaferrite (BaFe₁₂O₁₉) films were grown on (1–102) and (0001) cut α-Al₂O₃ (sapphire) substrates via laser molecular beam epitaxy using a one- or two-stage growth protocol. The advantages of a two-stage protocol are shown. The surface morphology, structural and magnetic properties of films were studied using atomic force microscopy, reflected high-energy electron diffraction, three-dimensional X-ray diffraction reciprocal space mapping, powder X-ray diffraction, magneto-optical, and magnetometric methods. Annealed BaFe₁₂O₁₉/Al₂O₃ (1–102) structures consist of close-packed islands epitaxially bonded to the substrate. The hexagonal crystallographic axis and the easy axis (EA) of the magnetization of the films are deflected from the normal to the film by an angle of φ~60°. The films exhibit magnetic hysteresis loops for both in-plane H_in-plane and out-of-plane H_out-of-plane magnetic fields. The shape of M_out-of-plane(H_in-plane) and M_in-plane(H_in-plane) hysteresis loops strongly depends on the azimuth θ of the H_{in plane}, confirming the tilted orientation of the EA. The M_out-of-plane(H_out-of-plane) magnetization curves are caused by the reversible rotation of magnetization and irreversible magnetization jumps associated with the appearance and motion of domain walls. In the absence of a magnetic field, the magnetization is oriented at an angle close to φ.