Integrating machine learning (ML) with Statistical Process Control (SPC) is important for Industry 4.0 environments. Contemporary manufacturing data exhibit high-dimensionality, autocorrelation, non-stationarity, and class imbalance, which challenge classical SPC assumptions. This systematic review, conducted following the PRISMA 2020 guidelines, provides a problem-driven synthesis that links these data challenges to corresponding methodological families in ML-based SPC. Specifically, we review approaches for (1) high-dimensional and redundant data (dimensionality reduction and feature selection), (2) autocorrelated and dynamic processes (time-series and state-space models), and (3) data scarcity and imbalance (cost-sensitive learning, generative modeling, and transfer learning). Nonlinearity is treated as a cross-cutting property within each category. For each, we outline the mathematical rationale of representative algorithms and illustrate their use with industrial examples. We also summarize open issues in interpretability, thresholding, and real-time deployment. This review offers structured guidance for selecting ML techniques suited to complex manufacturing data and for designing reliable online monitoring pipelines.

High-quality processes, characterized by low defect rates, typically exhibit an exponential distribution for time-between-events (TBE) data. To effectively monitor TBE data, one-sided exponential Adaptive Exponentially Weighted Moving Average (AEWMA) schemes are introduced. However, the run length (RL) distribution varies with the magnitude of the process mean shift, rendering the median run length (MRL) a more pertinent performance metric. This paper investigates the RL properties of one-sided exponential AEWMA schemes using a Markov chain method. An optimal design procedure based on MRL is developed to enhance the one-sided exponential AEWMA scheme. Comparative analyses reveal that the one-sided exponential AEWMA scheme provides better balanced protection against both minor and major shifts in the process mean compared to EWMA-type and Shewhart schemes. Finally, two practical case studies illustrate the application of AEWMA schemes in manufacturing.