This study proposes an advanced space radiation shielding design method that integrates multi-objective optimization with reliability evaluation to mitigate the impact of harsh space radiation environments on electronic systems. A genetic algorithm is employed to optimize multi-layer shielding configurations with respect to radiation dose reduction, mass efficiency, and structural thickness. To ensure practical applicability, a reliability evaluation framework incorporating uncertainty factors is developed, where shielding designs are considered acceptable when the risk confidence level (CL) remains below 5%. A case study simulating long-duration deep space missions demonstrates that the optimized five-layer shielding configuration reduces the radiation-induced failure rate by approximately 57%, enhancing the long-term reliability of core electronic components to 0.94 over a five-year mission. These findings validate the effectiveness of the proposed approach in supporting the development of reliable, lightweight radiation shielding for future space missions.