Hydration of the <1 μm size fraction of SWy-1 source clay (low-charge montmorillonite) was studied by modeling of X-ray diffraction (XRD) patterns recorded under controlled relative humidity (RH) conditions on Li-, Na-, K-, Mg-, Ca-, and Sr-saturated specimens. The quantitative description of smectite hydration, based on the relative proportions of different layer types derived from the fitting of experimental XRD patterns, was consistent with previous reports of smectite hydration. However, the coexistence of smectite layer types exhibiting contrasting hydration states was systematically observed, and heterogeneity rather than homogeneity seems to be the rule for smectite hydration. This heterogeneity can be characterized qualitatively using the standard deviation of the departure from rationality of the 00l reflection series (ξ), which is systematically larger than 0.4 Å when the prevailing layer type accounts for ~70% or less of the total layers (~25% of XRD patterns examined). In addition, hydration heterogeneities are not distributed randomly within smectite crystallites, and models describing these complex structures involve two distinct contributions, each containing different layer types that are interstratifed randomly. As a result, the different layer types are partially segregated in the sample. However, these two contributions do not imply the actual presence of two populations of particles in the sample. XRD profile modeling also has allowed the refinement of structural parameters, such as the location of interlayer species and the layer thickness corresponding to the different layer types, for all interlayer cations and RH values. From the observed dependence of the latter parameter on the cation ionic potential (v/r; v = cation valency and r = ionic radius) and on RH, the following equations were derived: which allow the quantification of the increase of layer thickness with increasing RH for both 1W (one water) and 2W (two water) layers. In addition, for 2W layers, interlayer H₂O molecules are probably distributed as a unique plane on each side of the central interlayer cation. This plane of H₂O molecules is located at ~1.20 Å from the central interlayer cation along the c* axis.

Hydration of the <1 μm size fraction of a high-charge montmorillonite (Clay Minerals Society Source Clay SAz-1), and of low- and high-charge beidellites (Source Clays SbId-1 and SbCa-1, respectively) was studied by modeling of X-ray diffraction patterns recorded under controlled relative humidity (RH) for Sr- and/or Ca-saturated specimens. The influence of layer charge and charge location on smectite hydration was studied. Distribution of layers with different hydration states (dehydrated–0W, monohydrated–1W, bihydrated–2W, or tri-hydrated–3W) within smectite crystals often leads to two distinct contributions to the X-ray diffraction pattern, each contribution having different layer types randomly interstratified. Structure models are more heterogeneous for beidellite than for montmorillonite. For beidellite, two distinct populations of particles with different coherent scattering domain sizes account for the heterogeneity. Increased hydration heterogeneity in beidellite originates also from the presence of 0W (non-expandable) and of 1W layers under high relative humidity (RH) conditions. Similarly, after ethylene-glycol (EG) solvation, some beidellite layers incorporate only one plane of EG molecules whereas homogeneous swelling was observed for montmorillonite with the systematic presence of two planes of EG molecules. For montmorillonite and beidellite, the increase of layer charge shifts the 2W-to-1W and the 1W-to-0W transitions toward lower RH values. For all samples, layer thickness of 0, 1, and 2W layer types was similar to that determined for low-charge SWy-1 montmorillonite (Source Clay SWy-1), and no change of layer thickness was observed as a function of the amount or of the location of layer charge. However, layer thickness increased with increasing RH conditions.