Xingchen Dong

Mr. Xingchen Dong

Department of Electrical and Computer Engineering, Institute for Measurement Systems and Sensor Technology, Technical University of Munich, Theresienstr. 90, Building N5, D-80333 Munich, Germany

Research Focus & Metrics

Academic Career Length

8Years (2019-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

View All Publications
7 August 2020 in IEEE Sensors Journal
Verified
Journal Article
Closed access
KWKun Wang
Kun Wang
Xingchen DongXingchen Dong
Xingchen Dong
MKMichael Köhler
Michael Köhler
PKPatrick Kienle
Patrick Kienle
QBQiang Bian
Qiang Bian
AKAlexander W. Koch
Alexander W. Koch
In recent years, optical fiber sensors based on multimode interference (MMI) have attracted increasing interest and developed into various sensors used in many practical applications. This review presents MMI-based fiber sensors with a specific focus on the probe structures, measurement methods, and sensing properties of different structures. The fundamentals of MMI-based fiber sensors are briefly described. Further, five main categories of SMS structure-based fiber sensors are reviewed, including conventional SMS fiber sensors, MMI-based sensors with no-core fiber (NCF), MMI-based sensors with etched/polished fiber, MMI-based sensors with tapered fiber, and cascades of MMI-based fiber sensors. Besides, their probe structures, sensing properties, practical fields, and measurement sensitivities are summarized. Finally, the current challenges and technique outlook of the MMI-based fiber sensors are pointed out, which gives the potential solutions for the existing problems and future development. This work indicates that the MMI-based fiber sensors bring the possibilities of applying multi-mode fiber (MMF) in different measurement fields with high sensitivities, easy fabrication, and low cost. With the appearance and development of new SMS fiber sensors, it will contribute significant value to scientific research and industrial applications.

19 January 2021 in ACS Nano
Verified
Journal Article
Closed access
Xingchen DongXingchen Dong
Xingchen Dong
HLHongwei Li
Hongwei Li
ZJZhutong Jiang
Zhutong Jiang
TGTheresa Grünleitner
Theresa Grünleitner
IGİnci Güler
İnci Güler
AKAlexander W. Koch
Alexander W. Koch

23 April 2020 in ACS Photonics
Verified
Journal Article
Closed access
Xingchen DongXingchen Dong
Xingchen Dong
AYAli K. Yetisen
Ali K. Yetisen
HTHeng Tian
Heng Tian
IGİnci Güler
İnci Güler
ASAndreas V. Stier
Andreas V. Stier
AKAlexander W. Koch
Alexander W. Koch

23 May 2019 in Advanced Optical Materials
Verified
Journal Article
Closed access
PDF file
Xingchen DongXingchen Dong
Xingchen Dong
AYAli K. Yetisen
Ali K. Yetisen
MKMichael H. Köhler
Michael H. Köhler
JDJie Dong
Jie Dong
SWShengjia Wang
Shengjia Wang
AKAlexander W. Koch
Alexander W. Koch

13 July 2022 in Advanced Theory and Simulations
Verified
Journal Article
Open access
Xingchen DongXingchen Dong
Xingchen Dong
HLHongwei Li
Hongwei Li
YYYuntian Yan
Yuntian Yan
HCHaoran Cheng
Haoran Cheng
HZHui Xin Zhang
Hui Xin Zhang
AKAlexander W. Koch
Alexander W. Koch
2D materials and their heterostructures are prominent for fabricating next‐generation optical and photonic devices. The optical, electrical, and mechanical properties of 2D materials largely depend on atomic layer numbers. Although machine learning techniques are implemented to identify large‐area thickness distribution using microscopic images, the existing work mainly focuses on rough identification of thicknesses with in‐house datasets which limits fair and comprehensive comparisons of new machine learning approaches. Here, first a microscopic dataset is collected and released for three fundamental image processing tasks including multilabel classification, segmentation, and detection. Then three deep‐learning architectures DenseNet, U‐Net, and Mask‐region convolutional neural network (RCNN) are benchmarked on three tasks and their robustness is evaluated on the augmented 2D microscopic images with different optical contrast variations. Deep learning models are trained and evaluated to identify mono‐, bi‐, tri‐, multilayer and bulk flakes using microscopic images of MoS2 fabricated on the SiO2/Si substrate by chemical vapor deposition. The relation between model performances and statistics of datasets is studied based on the international commission on illumination (CIE) 1931 color space and red, green, blue (RGB) histograms of optical contrast differences. Finally, the robust pretrained models are integrated into a graphic user interface for the on‐site use of full field‐of‐view images captured by bright‐field microscopes.

1 February 2019 in Pedosphere
Verified
Journal Article
Closed access
Xingchen DongXingchen Dong
Xingchen Dong
JZJian Zhang
Jian Zhang
HQHuizhen Qiu
Huizhen Qiu
HZHe Zhang
He Zhang
CLChaoyue Luo
Chaoyue Luo
ZJZhongjun Jia
Zhongjun Jia