A single lipid molecular bilayer of 17 or 18 carbon chain phosphocholines, floating in water near a flat wall, is prepared in the bilayer gel phase and then heated to the fluid phase. Its structure (electron density profile) and height fluctuations are determined by using x-ray reflectivity and nonspecular scattering. By fitting the off-specular signal to that calculated for a two-dimensional membrane using a Helfrich Hamiltonian, we determine the three main physical quantities that govern the bilayer height fluctuations: The wall attraction potential is unexpectedly low; the surface tension, roughly independent on chain length and temperature, is moderate (≈5 × 10 ^–4 J·m ^–2 ) but large enough to dominate the intermediate range of the fluctuation spectrum; and the bending modulus abruptly decreases by an order-of-magnitude from 10 ^–18 J to 10 ^–19 J at the bilayer gel-to-fluid transition.

The sealing mechanism of silicon bonding interfaces is reported as a function of annealing temperature. Details of the structural and chemical interface evolution are obtained for hydrophilic silicon/silicon and silicon/silicon dioxide wafer bonding, using x-ray reflectivity and infrared spectroscopy. A two-step mechanism is demonstrated: first a partial sealing of the interface driven by cross-wafer silanol bond condensation and second a water evacuation via oxide formation at the silicon oxide interface.

We present atomic force microscopy observations of the “effective” slippage of various nonpolar and polar liquids on alkylsilane coated glass surfaces. For small contact angle nonpolar liquids, the slip length decreases as one approaches a wetting transition. However, for large contact angle polar liquids it is found that the slip length is primarily influenced by the dipole moment, rather than the wettability of the liquid for the surface, where the slip length decreases with increasing dipole moment.