A fast multichannel Stokes/Mueller polarimeter with no mechanically moving parts has been designed to have close to optimal performance from 430 – 2000 nm by applying a genetic algorithm. Stokes (Mueller) polarimeters are characterized by their ability to analyze the full Stokes (Mueller) vector (matrix) of the incident light (sample). This ability is characterized by the condition number, κ, which directly influences the measurement noise in polarimetric measurements. Due to the spectral dependence of the retardance in birefringent materials, it is not trivial to design a polarimeter using dispersive components. We present here both a method to do this optimization using a genetic algorithm, as well as simulation results. Our results include fast, broad-band polarimeter designs for spectrographic use, based on 2 and 3 Ferroelectric Liquid Crystals, whose material properties are taken from measured values. The results promise to reduce the measurement noise significantly over previous designs, up to a factor of 4.5 for a Mueller polarimeter, in addition to extending the spectral range.
We calculate all the elements of the Mueller matrix for light scattering from a two-dimensional randomly rough lossy metal surface. The calculations are carried out for arbitrary angles of incidence by the use of nonperturbative numerical solutions of the reduced Rayleigh equations. We foresee that the ability to model polarization effects in light scattering from surfaces will enable better interpretation of experimental data and allow for the design of surfaces which possess useful polarization effects.
This paper reports on the design and implementation of a liquid crystal variable retarder based overdetermined spectroscopic Mueller matrix polarimeter, with parallel processing of all wavelengths. The system was designed using a modified version of a recently developed genetic algorithm [Letnes et al. Opt. Express 18, 22, 23095 (2010)]. A generalization of the eigenvalue calibration method is reported that allows the calibration of such overdetermined polarimetric systems. Out of several possible designs, one of the designs was experimentally implemented and calibrated. It is reported that the instrument demonstrated good performance, with a measurement accuracy in the range of 0.1% for the measurement of air.
The plasmonic response of nanoparticles is exploited in many subfields of science and engineering to enhance optical signals associated with probes of nanoscale and subnanoscale entities. We develop a numerical algorithm based on previous theoretical work that addresses the influence of a substrate on the plasmonic response of collections of nanoparticles of spherical shape. Our method is a real-space approach within the quasistatic limit that can be applied to a wide range of structures. We illustrate the role of the substrate through numerical calculations that explore single nanospheres and nanosphere dimers fabricated from either a Drude model metal or from silver on dielectric substrates and from dielectric spheres on silver substrates.
A formalism is introduced for the non-perturbative, purely numerical, solution of the reduced Rayleigh equation for the scattering of light from two-dimensional penetrable rough surfaces. Implementation and performance issues of the method, and various consistency checks of it, are presented and discussed. The proposed method is found, within the validity of the Rayleigh hypothesis, to give reliable results. For a non-absorbing metal surface the conservation of energy was explicitly checked, and found to be satisfied to within 0.03\%, or better, for the parameters assumed. This testifies to the accuracy of the approach and a satisfactory discretization. As an illustration, we calculate the full angular distribution of the mean differential reflection coefficient for the scattering of p- or s-polarized light incident on two-dimensional dielectric or metallic randomly rough surfaces defined by (isotropic or anisotropic) Gaussian and cylindrical power spectra. Simulation results obtained by the proposed method agree well with experimentally measured scattering data taken from similar well-characterized, rough metal samples, or to results obtained by other numerical methods.