This study introduces a novel, low-cost, and non-invasive method for characterizing the surface profile of transparent objects using double digital fringe projection (DDFP). By projecting dual sinusoidal patterns that generate a Moiré effect and applying a frequency-domain Gaussian filter, the system isolates relevant data for accurate phase recovery through the isotropic quadrature transform (IQT). Experimental validation with plastic and acrylic samples confirms the method’s high spatial resolution and robustness against ambient noise. Unlike traditional systems, this technique avoids coherent light sources and complex hardware, improving its accessibility for academic and industrial use in transparent surface metrology.