Fei Shen

Prof. Fei Shen

orcid

Research Focus & Metrics

Academic Career Length

8Years (2019-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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7 December 2024
Verified
Book Chapter
Closed access
PDF file
ZQZhen Qu
Zhen Qu
Xian TaoXian Tao
Xian Tao
Mukesh PrasadMukesh Prasad
Mukesh Prasad
FSFei Shen
Fei Shen
ZZzhengtao zhang
zhengtao zhang
GDGuiguang Ding
Guiguang Ding

17 November 2020 in IEEE Transactions on Instrumentation and Measurement
Verified
Journal Article
Closed access
CLchengkan lv
chengkan lv
FSFei Shen
Fei Shen
ZZzhengtao zhang
zhengtao zhang
DXDe Xu
De Xu
YHYonghao He
Yonghao He
In this paper, an anomaly detection method based on background reconstruction is proposed to perform defect inspection on the texture surface of the industrial products. This method consists of two modules: (i) An autoencoder integrated with generative adversarial network is utilized to reconstruct the textured background of the original image as a defect-free reference. Specifically, extra anomalous images are introduced and a mapping method of anomaly is given to improve the stability of reconstruction. (ii) A U-net based inspection network is trained to perform pixel-wise analysis of the differences between the original and the reconstructed defect-free image. During these processes, only artificial synthesized defective images are utilized to train the model without any real defective samples. A series of experiments are conducted on several texture images datasets and the industrial production line. The experimental results reveal the effectiveness and versatility of the proposed method.

18 December 2022 in Machines
Verified
Journal Article
Open access
PDF file
JWjing wei
jing wei
ZZzhengtao zhang
zhengtao zhang
FSFei Shen
Fei Shen
CLchengkan lv
chengkan lv
Defect generation is a crucial method for solving data problems in industrial defect detection. However, the current defect generation methods suffer from the problems of background information loss, insufficient consideration of complex defects, and lack of accurate annotations, which limits their application in defect segmentation tasks. To tackle these problems, we proposed a mask-guided background-preserving defect generation method, MDGAN (mask-guided defect generation adversarial networks). First, to preserve the normal background and provide accurate annotations for the generated defect samples, we proposed a background replacement module (BRM), to add real background information to the generator and guide the generator to only focus on the generation of defect content in specified regions. Second, to guarantee the quality of the generated complex texture defects, we proposed a double discrimination module (DDM), to assist the discriminator in measuring the realism of the input image and distinguishing whether or not the defects were distributed at specified locations. The experimental results on metal, fabric, and plastic products showed that MDGAN could generate diversified and high-quality defect samples, demonstrating an improvement in detection over the traditional augmented samples. In addition, MDGAN can transfer defects between datasets with similar defect contents, thus achieving zero-shot defect detection.

9 November 2019 in International Journal of Precision Engineering and Manufacturing
Verified
Journal Article
Closed access
PDF file
CLChengkan Lv
Chengkan Lv
ZZZhengtao Zhang
Zhengtao Zhang
FSFei Shen
Fei Shen
FZFeng Zhang
Feng Zhang
HSHu Su
Hu Su

15 January 2020 in IEEE Transactions on Industrial Electronics
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Journal Article
Closed access
FSFei Shen
Fei Shen
FQFangbo Qin
Fangbo Qin
ZZzhengtao zhang
zhengtao zhang
DXDe Xu
De Xu
JZJuan Zhang
Juan Zhang
WWWenrong Wu
Wenrong Wu

31 October 2024
Verified
Book Chapter
Closed access
PDF file
QSQingfeng Shi
Qingfeng Shi
JWjing wei
jing wei
FSFei Shen
Fei Shen
ZZzhengtao zhang
zhengtao zhang