Xue Peng

Dr. Xue Peng


Research Focus & Metrics

Academic Career Length

2Years (2025-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 October 2025 in Coatings
Verified
Journal Article
Open access
PDF file
BZBo Zhang
Bo Zhang
LZLan Zhang
Lan Zhang
SWShuai Wu
Shuai Wu
XPXue Peng
Xue Peng
XOXiao-ping Ouyang
Xiao-ping Ouyang
XZXu Zhang
Xu Zhang
Diamond-like carbon (DLC) films are valued for their high hardness and wear resistance, but their application in harsh environments is limited by high internal stress and poor corrosion resistance. Co-doping with transition metals offers a promising route to overcome these drawbacks by tailoring microstructure and enhancing multifunctional performance. However, the synergistic effects of Ni and Cr co-doping in DLC remain underexplored. In this study, Ni and Cr co-doped DLC (NiCr-DLC) films were fabricated using filtered cathodic vacuum arc deposition (FCVAD). By varying the C2H2 flow rate, the carbon content and microstructure evolved from columnar to fine-grained and compact structures. The optimized film (F55) achieved an ultralow surface roughness (Sa = 0.26 nm), even smoother than the Si substrate. The Ni–Cr co-doping promoted a nanocomposite structure, yielding a maximum hardness of 15.56 GPa and excellent wear resistance (wear rate: 4.45 × 10−7 mm3/N·m). Electrochemical tests revealed significantly improved corrosion resistance compared to AISI 304L stainless steel, with F55 exhibiting the highest corrosion potential, the lowest current density, and the largest impedance modulus. This work demonstrates that Ni-Cr co-doping effectively enhances the mechanical and corrosion properties of DLC films while improving surface quality, providing a viable strategy for developing robust, multifunctional protective coatings for demanding applications in aerospace, automotive, and biomedical systems.

4 January 2026 in Quantum Beam Science
Verified
Journal Article
Open access
PDF file
XPXue Peng
Xue Peng
JWjiang wenli
jiang wenli
RCRuotong Chang
Ruotong Chang
HHHongtao Hu
Hongtao Hu
SLShaSha Lv
ShaSha Lv
MQMenglin Qiu
Menglin Qiu
To investigate the in situ irradiation effects of gallium nitride at varying temperatures, we combined ion beam-induced luminescence spectroscopy with variable-temperature irradiation using a home-built IBIL system and a GIC4117 2 × 1.7 MV tandem accelerator. Unlike previous static studies—limited to post-irradiation or single-temperature luminescence—we in situ tracked dynamic luminescence changes throughout irradiation, directly capturing the real-time responses of luminescent centers to coupled temperature-dose variations—a rare capability in prior work. To clarify how irradiation and temperature affect the luminescent centers of GaN, we integrated density functional theory (DFT) calculations with literature analysis, then resolved the yellow luminescence band into three emission centers via Gaussian deconvolution: 1.78 eV associated with C/O impurities, 1.94 eV linked to VGa, and 2.2 eV corresponding to CN defects. Using a single-exponential decay model, we further quantified the temperature- and dose-dependent decay rates of these centers under dual-variable temperature and dose conditions. Experimental results show that low-temperature irradiation such as at 100 K suppresses the migration and recombination of VGa/CN point defects, significantly enhancing the radiation tolerance of the 1.94 eV and 2.2 eV emission centers; meanwhile, it reduces non-radiative recombination center density, stabilizing free excitons and donor-bound excitons, thereby improving near-band-edge emission center resistance. Notably, the 1.94 eV emission center linked to gallium vacancies exhibits superior cryogenic radiation tolerance due to slower defect migration and more stable free exciton/donor-bound exciton states. Collectively, these findings reveal a synergistic regulation mechanism of temperature and radiation fluence on defect stability, addressing a key gap in static studies, providing a basis for understanding degradation mechanisms of gallium nitride-based devices under actual operating conditions (coexisting temperature fluctuations and continuous radiation), and offering theoretical/experimental support for optimizing radiation-hardened gallium nitride devices for extreme environments such as space or nuclear applications.