A recently proposed phase coding method for absolute phase retrieval performs well because its codeword is embedded into phase domain rather than intensity. Then, the codeword can determine the fringe order for the phase unwrapping. However, for absolute phase retrieval with a large number of codewords, the traditional phase coding method becomes not so reliable. In this paper, we present a novel phase coding method to tackle this problem. Six additional fringe images can generate more than $64\left(2^6\right)$ unique codewords for correct absolute phase retrieval. The novel phase coding method can be used for absolute phase retrieval with high frequency. Experiment results demonstrate the proposed method is effective.

The three-dimensional measurement technique using binary pattern projection with projector defocusing has become increasingly important due to its high speed and high accuracy. To obtain even faster speed without sacrificing accuracy, a ternary Gray code-based phase-unwrapping method is proposed by using even fewer binary patterns, which makes it possible to efficiently and accurately unwrap the phase. Theoretical analysis, simulations, and experiments are presented to validate the proposed method’s efficiency and robustness.

Phase shifting profilometry (PSP) using binary fringe patterns with projector defocusing is promising for high-speed 3D shape measurement. To obtain a high-quality phase, the projector usually requires a high defocusing level, which leads to a drastic fall in fringe contrast. Due to its convenience and high speed, PSP using squared binary patterns with small phase shifting algorithms and slight defocusing is highly desirable. In this paper, the phase accuracies of the classical phase shifting algorithms are analyzed theoretically, and then compared using both simulation and experiment. We also adapt two algorithms for PSP using squared binary patterns, which include a Hilbert three-step PSP and a double three-step PSP. Both algorithms can increase phase accuracy, with the latter featuring additional invalid point detection. The adapted algorithms are also compared with the classical algorithms. Based on our analysis and comparison results, proper algorithm selection can be easily made according to the practical requirement.

A new method of 3D measurement based on a digital light processing (DLP) projector is presented. The projection model of the DLP projector is analyzed, and the relationship between the fringe patterns of the DLP and the fringe strips projected into the 3D space is proposed. Then the 3D shape of the object can be obtained by this relationship. Meanwhile a calibration method for this model is presented. Using this calibration method, parameters of the model can be obtained by a calibration plate, and there is no requirement for the plate to move precisely. This new 3D shape measurement method does not require any restrictions as that in the classical methods. The camera and projector can be put in an arbitrary position, and it is unnecessary to arrange the system layout in parallel, vertical, or other stringent geometry conditions. The experiments show that this method is flexible and is easy to carry out. The system calibration can be finished quickly, and the system is applicable to many shape measurement tasks.

We introduce a flexible error correction method for fringe projection profilometry (FPP) systems in the presence of local blur phenomenon. Local blur caused by global light transport such as camera defocus, projector defocus, and subsurface scattering will cause significant systematic errors in FPP systems. Previous methods, which adopt high-frequency patterns to separate the direct and global components, fail when the global light phenomenon occurs locally. In this paper, the influence of local blur on phase quality is thoroughly analyzed, and a concise error correction method is proposed to compensate the phase errors. For defocus phenomenon, this method can be directly applied. With the aid of spatially varying point spread functions and local frontal plane assumption, experiments show that the proposed method can effectively alleviate the system errors and improve the final reconstruction accuracy in various scenes. For a subsurface scattering scenario, if the translucent object is dominated by multiple scattering, the proposed method can also be applied to correct systematic errors once the bidirectional scattering-surface reflectance distribution function of the object material is measured.