Alexander V. Naumkin, Ph. D
Senior Research Fellow at Center for Molecular Structure Research of
A.N. Nesmeyanov Institute of Organoelement Compounds RAS
Vavilov st., 28, Moscow 119334, Russia
He was born in 1952 in Edrovo, Valdai district, Novgorod region, USSR.
Scientific interests:
XPS, AES, quantitative analysis, depth profiling, differential charging, ion-surface interactions, carbon-based materials, supported catalysts, transition metal complexes.
Experience:
Design of combined ion and electron induced Auger electron spectrometer.
Comparative study of Auger emission under electron and ion excitation.
XPS and AES study of optical coatings, high temperature superconductors, hard coatings for cutting tools, diamond-like films, biomedical and organic materials, natural and synthetic materials for nuclear waste deposition, compositional changes in simple and complex oxides under ion bombardment, depth profile optimization procedure based on true secondary peak.
Evaluation of published XPS data for NIST XPS Database.
XPS and AES study of interfaces between polymers and modifications of polymer surfaces, carbon-based materials (nanodiamonds, graphite, fullerenes, carbon nanotubes), supported catalysts, fuel cells. Analysis of satellite structure in photoelectron spectra of mono- and polynuclear 3d-transition metal complexes with various stoichiometry.
Alexander V. Naumkin, Ph. D
Senior Research Fellow at Center for Molecular Structure Research of
A.N. Nesmeyanov Institute of Organoelement Compounds RAS
Vavilov st., 28, Moscow 119334, Russia
He was born in 1952 in Edrovo, Valdai district, Novgorod region, USSR.
Scientific interests:
XPS, AES, quantitative analysis, depth profiling, differential charging, ion-surface interactions, carbon-based materials, supported catalysts, transition metal complexes.
Experience:
Design of combined ion and electron induced Auger electron spectrometer.
Comparative study of Auger emission under electron and ion excitation.
XPS and AES study of optical coatings, high temperature superconductors, hard coatings for cutting tools, diamond-like films, biomedical and organic materials, natural and synthetic materials for nuclear waste deposition, compositional changes in simple and complex oxides under ion bombardment, depth profile optimization procedure based on true secondary peak.
Evaluation of published XPS data for NIST XPS Database.
XPS and AES study of interfaces between polymers and modifications of polymer surfaces, carbon-based materials (nanodiamonds, graphite, fullerenes, carbon nanotubes), supported catalysts, fuel cells. Analysis of satellite structure in photoelectron spectra of mono- and polynuclear 3d-transition metal complexes with various stoichiometry.