Patricio Franco

Dr. Patricio Franco

orcid

Research Focus & Metrics

Academic Career Length

11Years (2016-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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13 November 2020 in International Journal of Precision Engineering and Manufacturing
Verified
Journal Article
Closed access
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PFPatricio Franco
Patricio Franco
JJJose Jodar
Jose Jodar

12 December 2017 in The International Journal of Advanced Manufacturing Technology
Verified
Journal Article
Closed access
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CMCarlos Mascaraque-Ramírez
Carlos Mascaraque-Ramírez
PFPatricio Franco
Patricio Franco

9 November 2020 in International Journal of Precision Engineering and Manufacturing
Verified
Journal Article
Closed access
PDF file
PFPatricio Franco
Patricio Franco
JJJose Jodar
Jose Jodar

21 December 2016 in International Journal of Material Forming
Verified
Journal Article
Closed access
PDF file
JMJuan Martínez-Pastor
Juan Martínez-Pastor
PFPatricio Franco
Patricio Franco
Francisco Javier Ramírez FernándezFrancisco Javier Ramírez Fernández
Francisco Javier Ramírez Fernández
PLPedro J. Lopez-Garcia
Pedro J. Lopez-Garcia

16 September 2024 in International Journal of Precision Engineering and Manufacturing
Verified
Journal Article
Open access
PDF file
JJJose Jodar
Jose Jodar
PFPatricio Franco
Patricio Franco
The measuring accuracy of coordinate measuring machines (CMMs) will be affected by the different geometrical and dynamic errors, including the deviations associated to the axis displacement, the working table and the part to be measured. This work is focused on the analysis of the influence of the position errors, repeatability errors and reversibility errors in 3-axis FXYZ coordinate measuring machines, and it will be developed by a numerical model that is known as EE-based stochastic model. This model implements a new error index that is named equivalent error (EE), which will integrate the totality of machine errors of the CMMs and will allow a global description of all these error sources by means of a unique error parameter. The results obtained by this numerical model have been compared with the application of a traditional method, and it was probed that the EE-based model makes possible an increase of a 13.29% in the linear modelling of the performance of CMMs from the machine errors considered in this work, which implies a relevant improvement for the analysis and description of the effect of the distinct error sources on the achievable measuring accuracy of CMMs. For this reason, the EE-based model will be of special interest for industrial applications such as the quality control to be applied inside the production systems dedicated to manufacture mechanical components of high dimensional accuracy.

12 August 2017
Verified
Book Chapter
Closed access
PDF file
JMJuan Martínez-Pastor
Juan Martínez-Pastor
PFPatricio Franco
Patricio Franco
DMDomingo Moratilla
Domingo Moratilla
PLPedro J. Lopez-Garcia
Pedro J. Lopez-Garcia