Krzysztof Dmitruk

Dr. Krzysztof Dmitruk


Research Focus & Metrics

Academic Career Length

12Years (2015-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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31 October 2016 in Signal, Image and Video Processing
Verified
Journal Article
Open access
PDF file
KDKrzysztof Dmitruk
Krzysztof Dmitruk
MDMarcin Denkowski
Marcin Denkowski
MMMichał Mazur
Michał Mazur
PMPaweł Mikołajczak
Paweł Mikołajczak
Dual-energy X-ray imaging has a vast range of application in security. Luggage inspection is an essential process for an airplane or court house security as well as securing mass events. An image of a content of some package may help to figure out if there is any dangerous object inside and avoid possibly threatening situation. As the raw X-ray images are not always easy to analyze and interpret, some image processing methods like an object detection, a frequency resolution increase or a pseudocoloring are being used. Since color can be a powerful tool to improve the usefulness of an information display, we propose pseudocoloring improvement by modifying material-based approach with edge detection to fill and sharpen color layers over the image making it easier to read and analyze. We demonstrate the effectiveness of the methods using real data, acquired from a professional dual-energy X-ray scanner.

1 January 2015 in IFAC-PapersOnLine
Verified
Journal Article
Closed access
MDMarcin Denkowski
Marcin Denkowski
KDKrzysztof Dmitruk
Krzysztof Dmitruk
LSLukasz Sadkowski
Lukasz Sadkowski

1 January 2015 in IFAC-PapersOnLine
Verified
Journal Article
Closed access
KDKrzysztof Dmitruk
Krzysztof Dmitruk
MMMichal Mazur
Michal Mazur
MDMarcin Denkowski
Marcin Denkowski
PMPawel Mikolajczak
Pawel Mikolajczak

1 March 2016 in International Journal of Electronics and Telecommunications
Verified
Journal Article
Open access
PDF file
KDKrzysztof Dmitruk
Krzysztof Dmitruk
MMMichał Mazur
Michał Mazur
MDMarcin Denkowski
Marcin Denkowski
PMPaweł Mikołajczak
Paweł Mikołajczak
An X-ray scanning and image processing have a vast range of applications in the security. An image of a content of some package being passed for example to an airplane or to the court house may help to figure out if there are any dangerous objects inside that package and to avoid possible threatening situation. As the raw X-ray images are not always easy to analyze and interpret, some image processing methods like an object detection, a frequency resolution increase or a pseudocolouring are being used. In this paper, we propose a pseudocoloring improvement over material based approach. By addition of the edge detection methods we fill and sharpen colour layers over the image, making it easier to interpret. We demonstrate the effectiveness of the methods using real data, acquired from a professional dual energy X-ray scanner.


12 December 2025 in Sensors
Verified
Journal Article
Open access
PDF file
KDKrzysztof Dmitruk
Krzysztof Dmitruk
Geometric inaccuracies in the design of X-ray baggage scanners can lead to significant image artifacts, such as banding and discontinuities, which compromise security screening effectiveness. Although comprehensive commercial solutions are available, constructing a custom X-ray scanner requires the precise alignment of detector arrays. This is a complex and time-consuming process when performed manually. The core of the proposed method is a computational model that calculates the optimal position and orientation for each detector card based on user-defined scanner dimensions and hardware parameters. To validate the geometry created with this method, its performance was compared against flat and arc-shaped geometries. The results demonstrate that the proposed method successfully generates geometries that produce continuous and artifact-free images. The study concludes that the developed software tool provides a robust and practical solution, significantly simplifying the complex task of scanner construction and accelerating the development of reliable, custom X-ray inspection systems.