Aimed at the low accuracy problem of shear strain measurement in Moiré methods, a two-dimensional (2D) Moiré phase analysis method is proposed for full-field deformation measurement with high accuracy. A grid image is first processed by the spatial phase-shifting sampling Moiré technique to get the Moiré phases in two directions, which are then conjointly analyzed for measuring 2D displacement and strain distributions. The strain especially the shear strain measurement accuracy is remarkably improved, and dynamic deformation is measurable from automatic batch processing of single-shot grid images. As an application, the 2D microscale strain distributions of a titanium alloy were measured, and the crack occurrence location was successfully predicted from strain concentration.

Phase measurement techniques using a single-shot carrier fringe pattern play an important role in optical science and technology and have been widely used for various applications. In this paper, we focus on the comparative study of two major fringe analysis techniques, the sampling moiré (SM) and the windowed Fourier transform (WFT). While SM converts a single-fringe pattern to multiple phase-shifted moiré fringe patterns to extract the phase information in the spatial domain, WFT obtains the phase information in the windowed Fourier domain; thus, the two methods look entirely different. We evaluate the phase extraction errors of SM and windowed Fourier ridges (WFRs) as a typical WFT method for both linear and nonlinear phases with/without noise against the reference Fourier transform (FT) technique. For the simulated fringe patterns with linear or nonlinear phase and different random noise level, all the methods have high phase extraction accuracies. For a real experiment with more complicated phase and discontinuities, SM and WFR, both local methods, yield quite similar results and outperform FT.