Xiangqiao Yan

Dr. Xiangqiao Yan


Research Focus & Metrics

Academic Career Length

25Years (2002-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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17 January 2019 in International Journal of Damage Mechanics
Verified
Journal Article
Closed access
BLBowen Liu
Bowen Liu
XYXiangqiao Yan
Xiangqiao Yan
In this paper, based on the thought of Modified Wöhler Curve Method (MWCM), a new general model for predicting multiaxial fatigue life with influence of mean stress is presented. Different from the MWCM, the expressions of multiaxiality effect and mean stress effect are located separately in the proposed fatigue equation, so that the new model can consider the impact of both axial and torsional mean stresses, and the equation form possesses excellent extendibility and variability. The wildly used von Mises equivalent stress is adopted as the fatigue parameter to improve computational efficiency. Finally, in conjunction with the Itoh criterion, the model can be trivially extended to perform non-proportional fatigue prediction with different mean stresses. Some representative fatigue tests published in the previous literature are used to verify this study.

1 February 2021 in Materials Chemistry and Physics
Verified
Journal Article
Closed access
SDShuliang Dou
Shuliang Dou
WZWeiyan Zhang
Weiyan Zhang
FRFeifei Ren
Feifei Ren
JGJinxin Gu
Jinxin Gu
HWHang Wei
Hang Wei
YLYao Li
Yao Li

1 July 2002 in Mathematics and Computers in Simulation
Verified
Journal Article
Closed access
XYXiangqiao Yan
Xiangqiao Yan
YWYoushan Wang
Youshan Wang
XFXijin Feng
Xijin Feng

19 July 2023 in Materials
Verified
Journal Article
Open access
PDF file
YWYuemin Wang
Yuemin Wang
XLXingang Li
Xingang Li
XYXiangqiao Yan
Xiangqiao Yan
Shuliang DouShuliang Dou
Shuliang Dou
YLYao Li
Yao Li
LWLei Wang
Lei Wang
Vanadium dioxide (VO2) thin films of different thicknesses were prepared by regulating the deposition time (2, 2.5, 3, and 3.5 h). The impact of deposition time on the microstructure, surface morphology, and cross-section morphology was investigated. The results showed that the grain size increased with the film thickness. Meanwhile, the influence of film thickness on the residual stress was evaluated by X-ray diffraction. The phenomenon of “compressive-to-tensile stress transition” was illustrated as the thickness increased. The change of dominant mechanism for residual stress was used for explaining this situation. First, the composition of residual stress indicates that growth stress play a key role. Then, the effect of “atomic shot peening” can be used to explain the compressive stress. Lastly, the increased grain size, lower grain boundary density, and “tight effect” in the progress of film growth cause tensile stress.

1 January 2006 in The Journal of Strain Analysis for Engineering Design
Verified
Journal Article
Closed access
XYXiangqiao Yan
Xiangqiao Yan
By means of a boundary element method (BEM), this paper is concerned with two kinds of mixed-mode crack specimens, i.e. the three-point bending and shear specimen with an offset edge crack and the ring specimen with a pair of radial cracks under diametral compression. The boundary element method consists of the constant displacement discontinuity element preented by Crouch and starfield and the crack-tip diplacement discontinuity element proposed by the author. Test examples are included to show that the numerical approach is very efficient and accurate for the stress intensity factor calculation of plane elasticity crack problems in both infinite and finite domains. Specifically, the stress intensity factors (SIFs) for these two kinds of mixed-mode crack specimens are given.

5 March 2020 in Crystals
Verified
Journal Article
Open access
PDF file
PZPanpan Zhang
Panpan Zhang
Ke ZhangKe Zhang
Ke Zhang
Shuliang DouShuliang Dou
Shuliang Dou
JZJiupeng Zhao
Jiupeng Zhao
XYXiangqiao Yan
Xiangqiao Yan
YLYao Li
Yao Li
Several kinds of polyimide (PI) films stemmed out of 4, 4’–diaminodiphenyl ether, as well as various structurally various aromatic dianhydride, were prepared. The films’ mechanical, dielectric, and dynamic mechanical attributes were put under investigation. According the findings, the PI films’ performance is significantly different as a result of their diverse structure. PI’s dielectric constant and dielectric loss tangent of abides by the increasing order below: PMDA-PI>BTDA-PI>BPDA-PI. Moreover, the electric breakdown strength of BTDA-PI (478.90 kV/mm) presents a lot higher value compared to the one PMDA-PI (326.80 kV/mm) and BPDA-PI (357.07 kV/mm). In particular, BTDA-PI film possesses high electric breakdown strength about 478.90 kV/mm. In addition, PI’s glass transition temperature (Tg) are, respectively, 276 °C (BTDA-PI), and 290 °C (BPDA-PI), as well as 302 °C (PMDA-PI). Therefore, in virtue of their various structures and performances, practical applications of PI films can exert significant role in the electronics and microelectronics industries.