Industrial-grade printed circuit boards (PCBs) exhibit high structural order and inherent geometric symmetry, where minute surface defects essentially constitute symmetry-breaking anomalies that disrupt topological integrity. Detecting these anomalies is quite challenging due to issues like scale variation and low contrast. Therefore, this paper proposes a symmetry-aware object detection framework, DAS-YOLO, based on an improved YOLOv11. The U-shaped adaptive feature extraction module (Def-UAD) reconstructs the C3K2 unit, overcoming the geometric limitations of standard convolutions through a deformation adaptation mechanism. This significantly enhances feature extraction capabilities for irregular defect topologies. A semantic-aware module (SADRM) is introduced at the backbone and neck regions. The lightweight and efficient ESSAttn improves the distinguishability of small or weak targets. At the same time, to address information asymmetry between deep and shallow features, an iterative attention feature fusion module (IAFF) is designed. By dynamically weighting and calibrating feature biases, it achieves structured coordination and balanced multi-scale representation. To evaluate the validity of the proposed method, we carried out comprehensive experiments using publicly accessible datasets focused on PCB defects. The results show that the Recall, mAP@50, and mAP@50-95 of DAS-YOLO reached 82.60%, 89.50%, and 46.60%, respectively, which are 3.7%, 1.8%, and 2.9% higher than those of the baseline model, YOLOv11n. Comparisons with mainstream detectors such as GD-YOLO and SRN further demonstrate a significant advantage in detection accuracy. These results confirm that the proposed framework offers a solution that strikes a balance between accuracy and practicality in addressing the key challenges in PCB surface defect detection.