Keke Zhang

Dr. Keke Zhang

School of Materials Science and Engineering, Henan University of Science and Technology
orcid

Research Focus & Metrics

Academic Career Length

19Years (2008-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 July 2010 in Materials Characterization
Verified
Journal Article
Closed access
RQRanfeng Qiu
Ranfeng Qiu
HSHongxin Shi
Hongxin Shi
KZKeke Zhang
Keke Zhang
YTYimin Tu
Yimin Tu
CIChihiro Iwamoto
Chihiro Iwamoto
SSShinobu Satonaka
Shinobu Satonaka

18 March 2021 in Scientific Reports
Verified
Journal Article
Open access
PDF file
JCJianguo Cui
Jianguo Cui
KZKeke Zhang
Keke Zhang
DZDi Zhao
Di Zhao
YPYibo Pan
Yibo Pan
Through ultrasonic wave assisted Sn2.5Ag0.7Cu0.1RExNi/Cu (x = 0, 0.05, 0.1) soldering test and − 40 to 125 °C thermal shock test, the microstructure and shear properties of Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints under thermal cycling were studied by the SEM, EDS and XRD. The results show that the Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints with high quality and high reliability can be obtained by ultrasonic assistance. When the ultrasonic vibration power is 88 W, the ultrasonic-assisted Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu solder joints exhibits the optimized performance. During the thermal cycling process, the shear strength of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints had a linear relationship with the thickness of interfacial intermetallic compound (IMC). Under the thermal cycling, the interfacial IMC layer of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints consisted of (Cu,Ni)6Sn5 and Cu3Sn. The thickness of interfacial IMC of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints was linearly related to the square root of equivalent time. The growth of interfacial IMC of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints had an incubation period, and the growth of IMC was slow within 300 cycles. And after 300 cycles, the IMC grew rapidly, the granular IMC began to merge, and the thickness and roughness of IMC increased obviously, which led to a sharp decrease in the shear strength of the solder joints. The 0.05 wt% Ni could inhibit the excessive growth of IMC, improve the shear strength of solder joints and improve the reliability of solder joints. The fracture mechanism of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints changed from the ductile–brittle mixed fracture in the solder/IMC transition zone to the brittle fracture in the interfacial IMC.

17 January 2019 in Materials
Verified
Journal Article
Open access
PDF file
MZMeng Zhang
Meng Zhang
KZKeke Zhang
Keke Zhang
FHFu-Peng Huo
Fu-Peng Huo
HWHuigai Wang
Huigai Wang
YWYang Wang
Yang Wang
Composite solder is a promising route to improve the properties and reliability of Sn-based lead-free solder. In this study, Cu-coated graphene nanosheets (Cu-GNSs) were synthesized using pyrolysis. Cu-GNSs reinforced Sn2.5Ag0.7Cu0.1RE composite lead-free solders were prepared via powder metallurgy. The size, distribution, and adsorption type of Cu nanoparticles on the GNSs were studied. The relation of the Cu-GNSs content and microstructure to the physical, wettability, and mechanical properties of composite solders was discussed. The results show that Cu nanoparticles (with a mean size of 13 nm) present uniform distribution and effective chemisorptions on the GNS. Microstructural evolution of composite solders is dependent on the addition of Cu-GNSs. With increasing Cu-GNSs addition, β-Sn grains become finer and the eutectic phase proportion becomes larger, while the morphology of the eutectic phase transforms from dispersion to network-type. The improvement of the tensile strength of the composite solder can be attributed to grain refinement and load transfer. While the existence of Cu-GNSs can effectively improve the wettability and slightly change the melting point, it can also lead to the decline of elongation and electrical conductivity of the composite solder.

1 July 2018 in Advanced Engineering Materials
Verified
Journal Article
Closed access
PDF file
FHFupeng Huo
Fupeng Huo
KZKeke Zhang
Keke Zhang
MZMeng Zhang
Meng Zhang
HWHuigai Wang
Huigai Wang

10 September 2018 in Journal of Materials Science: Materials in Electronics
Verified
Journal Article
Closed access
PDF file
DZDi Zhao
Di Zhao
KZKeke Zhang
Keke Zhang
JCJianguo Cui
Jianguo Cui
NMNing Ma
Ning Ma
YPYibo Pan
Yibo Pan
CYChenxiang Yin
Chenxiang Yin

5 May 2019 in Metals
Verified
Journal Article
Open access
PDF file
CCCongcong Cao
Congcong Cao
KZKeke Zhang
Keke Zhang
BSBaojin Shi
Baojin Shi
HWHuigai Wang
Huigai Wang
DZDi Zhao
Di Zhao
CZChao Zhang
Chao Zhang
The interface microstructure and shear strength of Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints under thermal-cycle loading were investigated with scanning electron microscope (SEM), energy dispersive spectroscopy (EDS), X-ray diffraction (XRD) and physical and chemical tests. The results show that an intermetallic compound (IMC) layer of Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints evolved gradually from the scalloped into larger wavy forms with increasing number of thermal cycles. The roughness and average thickness of IMC increased with thermal-cycle loading. However, at longer thermal-cycle loading, the shear strength of the joints was reduced by about 40%. The fracture pathway of solder joints was initiated in the solder seam with ductile fracture mechanism and propagated to the solder seam/IMC layer with ductile-brittle mixed-type fracture mechanism, when the number of thermal cycles increased from 100 to 500 cycles. By adding 0.05 wt.% Ni, the growth of the joint interface IMC could be controlled, and the roughness and average thickness of the interfacial IMC layer reduced. As a result, the shear strength of joints is higher than those without Ni. When compared to joint without Ni, the roughness and average thickness of 0.05 wt.% Ni solder joint interface IMC layer reached the minimum after 500 thermal cycles. The shear strength of that joint was reduced to a minimum of 36.4% of the initial state, to a value of 18.2 MPa.