An effective method for extraction of electromagnetic properties of bianisotropic biaxial omega-type metamaterial (MM) slabs from waveguide measurements is presented. The method relies on measurements of S-parameters of two MM slab configurations (transverse and longitudinal) to extract electromagnetic properties endowed with strong bianisotropic coupling. An uncertainty analysis is performed for examining the effect of geometrical parameters of the longitudinal configuration on its resonance characteristic. For verification of the proposed method, constitutive parameters of a polyethylene sample are extracted at the X-band (8.2-12.4 GHz). Then, the method is applied for extraction of electromagnetic properties of an MM slab (square split-ring resonators over FR4 substrate) using simulated and measured S-parameters for the two configurations at the X-band. It is noted that extracted electromagnetic properties obtained from measured S-parameters are in good agreement with those obtained from simulated S-parameters except for a small frequency shift and magnitude change, which could arise from fabrication tolerances, air gaps present between MM cells, and local irregular surface of the longitudinal configuration. For completeness, it is analyzed whether extracted properties satisfy the locality conditions.

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A free-space time-domain method is proposed to retrieve dielectric constant (ϵr), conductivity (σe), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to ϵr and σe. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract ϵr, σe, and d of polypropylene, polyethylene, and polyoxymethylene samples.

A recursive algorithm is proposed to accurately extract the electromagnetic parameters of isotropic/bianisotropic metamaterial (MM) slabs of inhomogeneous structures. The algorithm is based on the recursive calculations of measured/ simulated forward and backward scattering (S-) parameters from previously extracted wave impedances and refractive indices of each homogeneous layer (except the analyzed intermediate layer) by a suitable retrieval method. There are two main advantages of our proposed method over existing extraction algorithms. First, it could retrieve the electromagnetic parameters of both isotropic and bianisotropic MM slabs. Second, it is applicable for electromagnetic parameter extraction of inhomogeneous structures. For validation of our method and assessing its accuracy over existing extraction methods, we used the simulation results of various inhomogeneous structures constructed by different isotropic/bianisotropic MM slabs (split-ring-resonator (SRR), SRR-wire, omega, and omega-wire). For completeness, the effects of noise present in S-parameters and iterative error (by increasing the value of iteration numbers) are examined to test the robustness of the proposed algorithm.

A new de-embedding technique is proposed for relative complex permittivity εr determination of dielectric materials using gated free-space measurements. Its three main features are a) it does not require any formal calibration procedure (calibration-free), b) it is position-insensitive, and c) it extracts ripple-free εr due to gating process. The objective function derived to determine εr by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibration-free and calibration-dependent methods in the literature.

A broadband, stable, and non-iterative free-space method is proposed for dielectric constant ε ^′ _r determination of low-loss dielectric slabs from reflection-only measurements through simple calibration standards (reflect and air). It is applicable for dispersive samples and does not require thickness information. Simulations of non-disperive and dispersive samples are performed to validate our method. Dielectric constant measurements of polyethylene and Polyoxymethylene samples (9–11 GHz) are carried out to examine the accuracy of our method.