Stanislav Baňački

Mr. Stanislav Baňački


Research Focus & Metrics

Academic Career Length

1Year (2026-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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12 August 2026 in Solar
Verified
Journal Article
Open access
PDF file
Vladimír SzomosiVladimír Szomosi
Vladimír Szomosi
SBStanislav Baňački
Stanislav Baňački
JŠJúlius Šimčák
Július Šimčák
MBMarek Bobcek
Marek Bobcek
ZČZsolt Čonka
Zsolt Čonka
ZVZoltan Varga
Zoltan Varga
Deep networks dominate photovoltaic (PV) thermographic fault detection but need large annotated datasets and resist interpretation. We present a lightweight, interpretable infrared workflow combining support-vector-machine (SVM) module/background segmentation from four handcrafted features with an adaptive grid analysis labelling regions as nominal-intensity, high-intensity anomaly or low-intensity anomaly relative to a module-internal reference; the anomaly classes are inspection candidates, not confirmed faults. Evaluation used 21 close-range images of one 20 W module—recorded with the camera’s visible-light edge fusion active, so they are fused infrared/visible frames—and all 596 of a public five-sector UAV dataset. Segmentation against manual masks reached a mean intersection-over-union of 0.64; a feature ablation shows intensity statistics dominate, and an end-to-end Otsu pipeline gives almost the same high-intensity share (4.54% versus 4.50%): the SVM contributes reproducibility—removing the manual segmentation threshold, though not the empirical +48/−60 offsets—not accuracy. High-intensity regions concentrated in the module’s lower half, co-locating with a bus-bar defect known from hardware inspection—suggestive, not validated. The single-module, image-level close-range evaluation is optimistic, and the UAV shares, from a separately trained SVM, illustrate cross-domain application only. Segmentation runs at about 15 images per second on CPU. The method is a relative-intensity thermal screening workflow, not a validated defect-diagnosis or plant-health assessment method, and applies only where acquisition is controlled and the offsets are recalibrated for the target camera and palette.