Jian-An Wang

Prof. Jian-An Wang


Research Focus & Metrics

Academic Career Length

13Years (2014-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 November 2016 in Physica A: Statistical Mechanics and its Applications
Verified
Journal Article
Closed access
JWJian-An Wang
Jian-An Wang
XMXiaohui Ma
Xiaohui Ma
XWXinyu Wen
Xinyu Wen
QSQianlai Sun
Qianlai Sun

22 January 2020 in International Journal of Control, Automation, and Systems
Verified
Journal Article
Closed access
PDF file
JWJian-An Wang
Jian-An Wang
LFLi Fan
Li Fan
XWXin-Yu Wen
Xin-Yu Wen

16 January 2025 in Journal of Intelligent Manufacturing
Verified
Journal Article
Closed access
PDF file
NLNan Li
Nan Li
GXGang Xie
Gang Xie
XZXiaohong Zhang
Xiaohong Zhang
HSHui Shi
Hui Shi
XNXiaoyin Nie
Xiaoyin Nie
JWJinquan Wang
Jinquan Wang

1 August 2018 in International Journal of Control, Automation, and Systems
Verified
Journal Article
Closed access
PDF file
JWJian-An Wang
Jian-An Wang
XWXin-Yu Wen
Xin-Yu Wen

18 November 2015 in Neural Computing and Applications
Verified
Journal Article
Closed access
PDF file
JWJian-An Wang
Jian-An Wang

26 November 2025 in Computers
Verified
Journal Article
Open access
PDF file
LLLijuan Li
Lijuan Li
GXGang Xie
Gang Xie
YWYin Wang
Yin Wang
WYWang Yun
Wang Yun
JWJian-An Wang
Jian-An Wang
ZZZhicheng Zhao
Zhicheng Zhao
To improve the detection performance of small defects in photovoltaic modules, we propose an enhanced YOLOv11n model—YOLO-FAD. Its core innovations include the following: (1) integrating RFAConv into the backbone network and neck network to better capture small defect features in complex backgrounds; (2) adding DyC3K2 for adaptive convolution optimization to improve accuracy and robustness; (3) employing ASF for multi-layer feature fusion, and combining it with DyHead-detect in the fourth detection layer to refine the classification and localization of small targets. Testing on our dataset shows that YOLO-FAD achieves an overall accuracy of 94.6% (85.3% for small defects), outperforming YOLOv11n by 3.0% and 10.1% in mAP, respectively, and surpassing YOLOv12, RT-DETR, Improved Faster-RCNN, and state-of-the-art (SOTA) improved models.