We present a silicon-nanobrick metasurface for dual-channel polarization-multiplexed holography at 1.55 μm. A Jones-matrix design combined with a Fresnel-based Gerchberg–Saxton algorithm maps the target phase profiles to nanobrick dimensions and orientations, enabling combined propagation-phase and geometric-phase control. Numerical simulations demonstrate holographic reconstruction for orthogonal linear, circular, and elliptical polarization pairs. The selected meta-atoms exhibit simulated power transmittances above 70% along both principal axes under periodic boundary conditions. The circular-polarization design is fabricated using electron beam lithography and hard-mask etching, and polarization-selective far-field reconstruction is experimentally observed. Further numerical analysis demonstrates continuous variation of the relative reconstructed intensities along an incident-polarization trajectory. Under an ideal collection and analyzer model, separately optimized elliptical analyzers provide central-signal suppression of 19.02 and 18.78 dB while retaining 64.30% and 61.71% of the corresponding target-image signals. An additional simulated design reconstructs two images within the same spatial region, yielding polarization-channel extinction ratios of 9.30 and 9.33 dB under fixed circular-analyzer conditions. These results demonstrate a silicon-based implementation of dual-channel holographic encoding and provide quantitative characterization of polarization-selective readout.

Dust deposition on photovoltaic (PV) surfaces reduces the light reaching the cells. This article establishes a scattering and transmission model of dust accumulation on photovoltaic panels based on the Bidirectional Reflectance Distribution Function (BRDF) model. It analyzes the influence of the dust particle composition, size, quantity, and other parameters on the light-transmission characteristics of photovoltaic panels, constructs an electromagnetic model of dust-accumulated photovoltaic panels, and studies the effect of different amounts of dust accumulation on the scattering and reflection characteristics of the panels. By setting up a scattering measurement platform and using modulated active light sources for illumination, it explores the scattering and transmittance rates of photovoltaic panels under different levels of dust accumulation. A comparison of the mean experimental results from five different positions with the theoretical predictions yields mean absolute errors of 4.23 percentage points for transmittance and 21.28 ppm for the scattering rate. Modulated illumination and lock-in detection were used to suppress ambient-light interference during the laboratory measurements. The combined transmittance and scattering measurements characterize changes in surface soiling at 635 nm and provide a basis for developing site-calibrated optical indicators to support photovoltaic inspection and cleaning decisions.