Current density–voltage (J-V) characteristics of hole-only devices using indium tin oxide (ITO) anode and N,N′-diphenyl-N,N′-bis(1-naphthyl)-1,1′-biphenyl-4,4′-diamine (α-NPD) layers were measured with various thicknesses of a molybdenum trioxide (MoO3) buffer layer inserted between ITO and α-NPD. The device with a 0.75-nm-thick MoO3 layer forms Ohmic hole injection at the ITO∕MoO3∕α-NPD interfaces and J-V characteristics of this device are controlled by a space-charge-limited current. Results of X-ray photoelectron and ultraviolet/visible/near-infrared absorption studies revealed that this Ohmic hole injection is attributable to an electron transfer from ITO and α-NPD to MoO3.
The authors report the systematic control of as a function of the film thickness of molybdenum trioxide buffer layer in the organic solar cells. The open-circuit voltage increased from as the thickness of film is increased from in the device structure of indium-tin-oxide /tetraphenylporphine /bathocuproine . The values between and the ionization potential of on ITO exhibit linear relationship, where the values change from as they increase from . The enhancement of was achieved without affecting short-circuit current density and fill factor. Consequently, the power conversion efficiency of the device increases from 1.24% to 1.88% primarily due to the increase in .
Supramolecular nanorods of 5,15-diaryl-substituted porphyrins prepared by sonication method exhibit a broad absorption property, which is confirmed by photocurrent generation measurement in a photoelectrochemical cell.
A blue phosphorescent organic light emitting device fabricated under the ultra high vacuum (UHV) condition of 6.5 × 10−7 Pa decreases the initial luminance drop upon lifetesting under a constant dc current of 15 mA/cm2 by 3 times compared to a device fabricated under a high vacuum (HV) condition of 7.6 × 10−6 Pa resulting in a 23% increase in half lifetime. We calculate a water content of 10−4 mol. % in the UHV device emissive layer (EML) and 10−2 mol. % in the HV device EML. We discuss the effects of water on luminance loss and voltage rise for the devices.
25 June 2012 in The Journal of Physical Chemistry Letters