This paper discusses the efficiency of a moderation effect in a mixture of SF₆ and N₂ gases, in case of the application of impulse voltages with varying rise times. The moderation in question pertains to the slowing down of free electrons through nonelastic collisions with molecules of N₂ gas, which increases the probability, i.e. the effective cross-section, for the formation of negative ions of SF₆. Variable parameters included relative mixture composition, pressure, inter-electrode gap, shape of the electric field, and the manner of electrode surface processing. By applying statistical analysis to experimentally obtained values of the impulse breakdown voltage random variable, and presenting the results as impulse characteristics, it was established that a positive synergetic effect of adding N₂ gas into the mixture was achieved at smaller impulse speeds. This effect was lost at greater impulse speeds. The obtained results were explained by examining the relative ratio of the time constant characterizing the process of moderating the spectrum (statistical distribution of energy) of free electrons, to the characteristic time of elementary electric discharge processes in gases.

Two types of three-electrode gas-insulated spark gaps have been investigated in this paper: one with the third electrode located inside the main electrode, and the other with a separate third electrode. Three types of insulating media have been used: vacuum, SF₆ and N₂. Additionally, three different electrode materials have been implemented: copper, steel and tungsten. The following characteristics have been tested experimentally: the influence of insulating gas parameters on spark gap operation, the influence of the polarity of working and trigger voltages on spark gap operation, and the influence of the rate of rise of the trigger voltage on spark gap operation and the degree of spark gap irreversibility. A theoretical model of the spark gap is presented in the paper, which provides a basis for explaining experimental results depending on specific characteristics of the spark gap.

This paper examines and compares the effects of exposing commercial, off the shelf erasable programmable read-only memory (EPROM) and electrically erasable programmable read-only memory (E²PROM) components to gamma rays. Results obtained for CMOS-based EPROM (NM27C010) and E²PROM (NM93CS46) components provide evidence that EPROMs have a greater radiation hardness than E²PROMs. Moreover, the changes in EPROMs are reversible, and after erasure and reprogramming all EPROM components restore their functionality. On the other hand, changes in E²PROMs are irreversible. The obtained results are analyzed and interpreted on the basis of gamma ray interaction with the CMOS structure.

The effects of exposing titanium dioxide memristors to ion beams are investigated through Monte Carlo simulation of particle transport. A model assuming ohmic electronic conduction and linear ionic drift in the memristor is utilized. The memristor is composed of a double-layer titanium dioxide thin film between two platinum electrodes. Obtained results suggest that a significant generation of oxygen ion/oxygen vacancy pairs in the oxide is to be expected along ion tracks. These can influence the device’s operation by lowering the resistance of the stoichiometric oxide region and the mobility of the vacancies. Changes induced by ion irradiation affect the current-voltage characteristic and state retention ability of the memristor. If the displaced oxygen ions reach the platinum electrodes, they can form the O2 gas and cause a permanent disruption of memristor functionality.

Mechanisms of gas breakdown initiation and development in the range to the left of the Paschen minimum are investigated in this paper. Experiments were conducted for gas pressures from 10^-9 to 10^-1 bar and inter-electrode gaps from 0.1 to 1 mm. The obtained results were subjected to the Chauvenet's criterion for discarding spurious values, the U-test for checking if they belonged to a common statistical distribution, and the chisquared test for testing their adherence to one of the considered theoretical distributions (normal, Weibull or double-exponential). The statistical analysis shows that the region left of the Paschen minimum can be divided into three subregions. It is established that the so called anomalous Paschen effect refers to breakdown occuring by way of the edge mechanisms in the first subregion, just next to the Paschen minimum. In the second subregion, breakdown emerges through the vacuum avalanche mechanism, and in the third subregion it occurs through the vacuum cathode emission mechanism.

This paper presents measurement results for the random variable "vacuum breakdown voltage", obtained by the application of pulse, dc, and ac voltage. Parameters varied during the measurements were: 1) vacuum pressure and 2) inter-electrode gap width. The measurements were performed under strictly controlled laboratory conditions. Conclusions about the influence that the variable parameters in the experiment exert on the parameters of theoretical statistical distributions have been drawn, based on the statistical analysis of the obtained experimental results. The obtained results have been explained by the mechanisms constituting the process of electrical breakdown in vacuum.